Laser device and method of determining a malfunction of a laser diode
A laser device includes a laser diode configured to emit radiation, an output power of the radiation being dependent on a laser diode driving current, and a photodiode configured to receive the radiation emitted by the laser diode. A photodiode current induced in the photodiode by the received radia...
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creator | Wolf, Robert Gerlach, Philipp Henning Weidenfeld, Susanne Sofke, Soren |
description | A laser device includes a laser diode configured to emit radiation, an output power of the radiation being dependent on a laser diode driving current, and a photodiode configured to receive the radiation emitted by the laser diode. A photodiode current induced in the photodiode by the received radiation is dependent on a power of the received radiation. The laser device further includes circuitry configured to measure the photodiode current for a laser diode driving current and calculate a laser threshold current of the laser diode from the measured photodiode current as a measure of an actual laser threshold current of the laser diode. The circuitry is further configured to detect a malfunction or degradation of the laser diode. |
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A photodiode current induced in the photodiode by the received radiation is dependent on a power of the received radiation. The laser device further includes circuitry configured to measure the photodiode current for a laser diode driving current and calculate a laser threshold current of the laser diode from the measured photodiode current as a measure of an actual laser threshold current of the laser diode. The circuitry is further configured to detect a malfunction or degradation of the laser diode.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240618&DB=EPODOC&CC=US&NR=12015240B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240618&DB=EPODOC&CC=US&NR=12015240B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wolf, Robert</creatorcontrib><creatorcontrib>Gerlach, Philipp Henning</creatorcontrib><creatorcontrib>Weidenfeld, Susanne</creatorcontrib><creatorcontrib>Sofke, Soren</creatorcontrib><title>Laser device and method of determining a malfunction of a laser diode</title><description>A laser device includes a laser diode configured to emit radiation, an output power of the radiation being dependent on a laser diode driving current, and a photodiode configured to receive the radiation emitted by the laser diode. A photodiode current induced in the photodiode by the received radiation is dependent on a power of the received radiation. The laser device further includes circuitry configured to measure the photodiode current for a laser diode driving current and calculate a laser threshold current of the laser diode from the measured photodiode current as a measure of an actual laser threshold current of the laser diode. The circuitry is further configured to detect a malfunction or degradation of the laser diode.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>DEVICES USING STIMULATED EMISSION</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD1SSxOLVJISS3LTE5VSMxLUchNLcnIT1HITwMKlqQW5WbmZealKyQq5CbmpJXmJZdk5ueBJBMVciA6M_NTUnkYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSXxosKGRgaGpkYmBk5ExMWoAlTMydw</recordid><startdate>20240618</startdate><enddate>20240618</enddate><creator>Wolf, Robert</creator><creator>Gerlach, Philipp Henning</creator><creator>Weidenfeld, Susanne</creator><creator>Sofke, Soren</creator><scope>EVB</scope></search><sort><creationdate>20240618</creationdate><title>Laser device and method of determining a malfunction of a laser diode</title><author>Wolf, Robert ; Gerlach, Philipp Henning ; Weidenfeld, Susanne ; Sofke, Soren</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US12015240B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>DEVICES USING STIMULATED EMISSION</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Wolf, Robert</creatorcontrib><creatorcontrib>Gerlach, Philipp Henning</creatorcontrib><creatorcontrib>Weidenfeld, Susanne</creatorcontrib><creatorcontrib>Sofke, Soren</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wolf, Robert</au><au>Gerlach, Philipp Henning</au><au>Weidenfeld, Susanne</au><au>Sofke, Soren</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Laser device and method of determining a malfunction of a laser diode</title><date>2024-06-18</date><risdate>2024</risdate><abstract>A laser device includes a laser diode configured to emit radiation, an output power of the radiation being dependent on a laser diode driving current, and a photodiode configured to receive the radiation emitted by the laser diode. A photodiode current induced in the photodiode by the received radiation is dependent on a power of the received radiation. The laser device further includes circuitry configured to measure the photodiode current for a laser diode driving current and calculate a laser threshold current of the laser diode from the measured photodiode current as a measure of an actual laser threshold current of the laser diode. The circuitry is further configured to detect a malfunction or degradation of the laser diode.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES USING STIMULATED EMISSION ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | Laser device and method of determining a malfunction of a laser diode |
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