Gas analysis device and method for detecting sample gas

The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion...

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Hauptverfasser: Wang, Yan, Yang, Nei, Liu, Yaohong, Li, Jianmin, Li, Guangqin, Chen, Zhiqiang, Zhang, Qingjun, Hao, Zhongyuan, Li, Yuanjing, Li, Ge
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creator Wang, Yan
Yang, Nei
Liu, Yaohong
Li, Jianmin
Li, Guangqin
Chen, Zhiqiang
Zhang, Qingjun
Hao, Zhongyuan
Li, Yuanjing
Li, Ge
description The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11994492B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11994492B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11994492B23</originalsourceid><addsrcrecordid>eNrjZDB3TyxWSMxLzKkszixWSEkty0xOBfJTFHJTSzLyUxTS8ouAoiWpySWZeekKxYm5BTmpCumJxTwMrGmJOcWpvFCam0HRzTXE2UM3tSA_PrW4IDE5NS-1JD402NDQ0tLExNLIyciYGDUApuYtvg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Gas analysis device and method for detecting sample gas</title><source>esp@cenet</source><creator>Wang, Yan ; Yang, Nei ; Liu, Yaohong ; Li, Jianmin ; Li, Guangqin ; Chen, Zhiqiang ; Zhang, Qingjun ; Hao, Zhongyuan ; Li, Yuanjing ; Li, Ge</creator><creatorcontrib>Wang, Yan ; Yang, Nei ; Liu, Yaohong ; Li, Jianmin ; Li, Guangqin ; Chen, Zhiqiang ; Zhang, Qingjun ; Hao, Zhongyuan ; Li, Yuanjing ; Li, Ge</creatorcontrib><description>The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240528&amp;DB=EPODOC&amp;CC=US&amp;NR=11994492B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240528&amp;DB=EPODOC&amp;CC=US&amp;NR=11994492B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wang, Yan</creatorcontrib><creatorcontrib>Yang, Nei</creatorcontrib><creatorcontrib>Liu, Yaohong</creatorcontrib><creatorcontrib>Li, Jianmin</creatorcontrib><creatorcontrib>Li, Guangqin</creatorcontrib><creatorcontrib>Chen, Zhiqiang</creatorcontrib><creatorcontrib>Zhang, Qingjun</creatorcontrib><creatorcontrib>Hao, Zhongyuan</creatorcontrib><creatorcontrib>Li, Yuanjing</creatorcontrib><creatorcontrib>Li, Ge</creatorcontrib><title>Gas analysis device and method for detecting sample gas</title><description>The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB3TyxWSMxLzKkszixWSEkty0xOBfJTFHJTSzLyUxTS8ouAoiWpySWZeekKxYm5BTmpCumJxTwMrGmJOcWpvFCam0HRzTXE2UM3tSA_PrW4IDE5NS-1JD402NDQ0tLExNLIyciYGDUApuYtvg</recordid><startdate>20240528</startdate><enddate>20240528</enddate><creator>Wang, Yan</creator><creator>Yang, Nei</creator><creator>Liu, Yaohong</creator><creator>Li, Jianmin</creator><creator>Li, Guangqin</creator><creator>Chen, Zhiqiang</creator><creator>Zhang, Qingjun</creator><creator>Hao, Zhongyuan</creator><creator>Li, Yuanjing</creator><creator>Li, Ge</creator><scope>EVB</scope></search><sort><creationdate>20240528</creationdate><title>Gas analysis device and method for detecting sample gas</title><author>Wang, Yan ; Yang, Nei ; Liu, Yaohong ; Li, Jianmin ; Li, Guangqin ; Chen, Zhiqiang ; Zhang, Qingjun ; Hao, Zhongyuan ; Li, Yuanjing ; Li, Ge</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11994492B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Wang, Yan</creatorcontrib><creatorcontrib>Yang, Nei</creatorcontrib><creatorcontrib>Liu, Yaohong</creatorcontrib><creatorcontrib>Li, Jianmin</creatorcontrib><creatorcontrib>Li, Guangqin</creatorcontrib><creatorcontrib>Chen, Zhiqiang</creatorcontrib><creatorcontrib>Zhang, Qingjun</creatorcontrib><creatorcontrib>Hao, Zhongyuan</creatorcontrib><creatorcontrib>Li, Yuanjing</creatorcontrib><creatorcontrib>Li, Ge</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wang, Yan</au><au>Yang, Nei</au><au>Liu, Yaohong</au><au>Li, Jianmin</au><au>Li, Guangqin</au><au>Chen, Zhiqiang</au><au>Zhang, Qingjun</au><au>Hao, Zhongyuan</au><au>Li, Yuanjing</au><au>Li, Ge</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Gas analysis device and method for detecting sample gas</title><date>2024-05-28</date><risdate>2024</risdate><abstract>The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Gas analysis device and method for detecting sample gas
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