Systems and method for dynamically updating materiality distributions and classifications

A data analysis system for measuring a materiality feature of interest is disclosed. The system includes a computing cluster ingesting content comprising a plurality of observables relevant to an entity, wherein each observable is related to at least one feature of interest. The system further inclu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Hawley, James, Flowers, Michael Alfred, Shipley, Andrew, Bala, Greg Paul, Salvatori, Adam L, Reisman, Eli, Brinkmann, Sebastian, Malinak, Stephen, Bartel, Hendrik, Kuh, Edwin, Strehlow, Mark, Kim, Philip
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Hawley, James
Flowers, Michael Alfred
Shipley, Andrew
Bala, Greg Paul
Salvatori, Adam L
Reisman, Eli
Brinkmann, Sebastian
Malinak, Stephen
Bartel, Hendrik
Kuh, Edwin
Strehlow, Mark
Kim, Philip
description A data analysis system for measuring a materiality feature of interest is disclosed. The system includes a computing cluster ingesting content comprising a plurality of observables relevant to an entity, wherein each observable is related to at least one feature of interest. The system further includes an extraction engine running on the computing cluster and tagging the observables with an entity identifier in response to the observables referencing at least one of an entity, a tradename associated with the entity, or product associated with the entity. Additionally, the system includes an analysis engine running on the computing cluster and tagging an observable in response to the feature of interest being related to the observable. In one embedment, the analysis engine measures the materiality of the feature of interest to the entity by counting a number of observables from the plurality of observables tagged with the entity identifier.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11989182B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11989182B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11989182B23</originalsourceid><addsrcrecordid>eNqNizkOwkAMANNQIOAP5gEUG5qkBYHoAwVVZLIOsbSX1k6xvwcBD6AaaTSzrO5dESUvgMGCJ52ihTFmsCWg5wGdKzAni8rhCR6VMqNjLWBZNPNjVo7hew8ORXh8Tx-3rhYjOqHNj6tqez5dj5cdpdiTJBwokPa3zpi2aU1TH-r9P80Lgcc8Mg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Systems and method for dynamically updating materiality distributions and classifications</title><source>esp@cenet</source><creator>Hawley, James ; Flowers, Michael Alfred ; Shipley, Andrew ; Bala, Greg Paul ; Salvatori, Adam L ; Reisman, Eli ; Brinkmann, Sebastian ; Malinak, Stephen ; Bartel, Hendrik ; Kuh, Edwin ; Strehlow, Mark ; Kim, Philip</creator><creatorcontrib>Hawley, James ; Flowers, Michael Alfred ; Shipley, Andrew ; Bala, Greg Paul ; Salvatori, Adam L ; Reisman, Eli ; Brinkmann, Sebastian ; Malinak, Stephen ; Bartel, Hendrik ; Kuh, Edwin ; Strehlow, Mark ; Kim, Philip</creatorcontrib><description>A data analysis system for measuring a materiality feature of interest is disclosed. The system includes a computing cluster ingesting content comprising a plurality of observables relevant to an entity, wherein each observable is related to at least one feature of interest. The system further includes an extraction engine running on the computing cluster and tagging the observables with an entity identifier in response to the observables referencing at least one of an entity, a tradename associated with the entity, or product associated with the entity. Additionally, the system includes an analysis engine running on the computing cluster and tagging an observable in response to the feature of interest being related to the observable. In one embedment, the analysis engine measures the materiality of the feature of interest to the entity by counting a number of observables from the plurality of observables tagged with the entity identifier.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240521&amp;DB=EPODOC&amp;CC=US&amp;NR=11989182B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240521&amp;DB=EPODOC&amp;CC=US&amp;NR=11989182B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hawley, James</creatorcontrib><creatorcontrib>Flowers, Michael Alfred</creatorcontrib><creatorcontrib>Shipley, Andrew</creatorcontrib><creatorcontrib>Bala, Greg Paul</creatorcontrib><creatorcontrib>Salvatori, Adam L</creatorcontrib><creatorcontrib>Reisman, Eli</creatorcontrib><creatorcontrib>Brinkmann, Sebastian</creatorcontrib><creatorcontrib>Malinak, Stephen</creatorcontrib><creatorcontrib>Bartel, Hendrik</creatorcontrib><creatorcontrib>Kuh, Edwin</creatorcontrib><creatorcontrib>Strehlow, Mark</creatorcontrib><creatorcontrib>Kim, Philip</creatorcontrib><title>Systems and method for dynamically updating materiality distributions and classifications</title><description>A data analysis system for measuring a materiality feature of interest is disclosed. The system includes a computing cluster ingesting content comprising a plurality of observables relevant to an entity, wherein each observable is related to at least one feature of interest. The system further includes an extraction engine running on the computing cluster and tagging the observables with an entity identifier in response to the observables referencing at least one of an entity, a tradename associated with the entity, or product associated with the entity. Additionally, the system includes an analysis engine running on the computing cluster and tagging an observable in response to the feature of interest being related to the observable. In one embedment, the analysis engine measures the materiality of the feature of interest to the entity by counting a number of observables from the plurality of observables tagged with the entity identifier.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizkOwkAMANNQIOAP5gEUG5qkBYHoAwVVZLIOsbSX1k6xvwcBD6AaaTSzrO5dESUvgMGCJ52ihTFmsCWg5wGdKzAni8rhCR6VMqNjLWBZNPNjVo7hew8ORXh8Tx-3rhYjOqHNj6tqez5dj5cdpdiTJBwokPa3zpi2aU1TH-r9P80Lgcc8Mg</recordid><startdate>20240521</startdate><enddate>20240521</enddate><creator>Hawley, James</creator><creator>Flowers, Michael Alfred</creator><creator>Shipley, Andrew</creator><creator>Bala, Greg Paul</creator><creator>Salvatori, Adam L</creator><creator>Reisman, Eli</creator><creator>Brinkmann, Sebastian</creator><creator>Malinak, Stephen</creator><creator>Bartel, Hendrik</creator><creator>Kuh, Edwin</creator><creator>Strehlow, Mark</creator><creator>Kim, Philip</creator><scope>EVB</scope></search><sort><creationdate>20240521</creationdate><title>Systems and method for dynamically updating materiality distributions and classifications</title><author>Hawley, James ; Flowers, Michael Alfred ; Shipley, Andrew ; Bala, Greg Paul ; Salvatori, Adam L ; Reisman, Eli ; Brinkmann, Sebastian ; Malinak, Stephen ; Bartel, Hendrik ; Kuh, Edwin ; Strehlow, Mark ; Kim, Philip</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11989182B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Hawley, James</creatorcontrib><creatorcontrib>Flowers, Michael Alfred</creatorcontrib><creatorcontrib>Shipley, Andrew</creatorcontrib><creatorcontrib>Bala, Greg Paul</creatorcontrib><creatorcontrib>Salvatori, Adam L</creatorcontrib><creatorcontrib>Reisman, Eli</creatorcontrib><creatorcontrib>Brinkmann, Sebastian</creatorcontrib><creatorcontrib>Malinak, Stephen</creatorcontrib><creatorcontrib>Bartel, Hendrik</creatorcontrib><creatorcontrib>Kuh, Edwin</creatorcontrib><creatorcontrib>Strehlow, Mark</creatorcontrib><creatorcontrib>Kim, Philip</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hawley, James</au><au>Flowers, Michael Alfred</au><au>Shipley, Andrew</au><au>Bala, Greg Paul</au><au>Salvatori, Adam L</au><au>Reisman, Eli</au><au>Brinkmann, Sebastian</au><au>Malinak, Stephen</au><au>Bartel, Hendrik</au><au>Kuh, Edwin</au><au>Strehlow, Mark</au><au>Kim, Philip</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Systems and method for dynamically updating materiality distributions and classifications</title><date>2024-05-21</date><risdate>2024</risdate><abstract>A data analysis system for measuring a materiality feature of interest is disclosed. The system includes a computing cluster ingesting content comprising a plurality of observables relevant to an entity, wherein each observable is related to at least one feature of interest. The system further includes an extraction engine running on the computing cluster and tagging the observables with an entity identifier in response to the observables referencing at least one of an entity, a tradename associated with the entity, or product associated with the entity. Additionally, the system includes an analysis engine running on the computing cluster and tagging an observable in response to the feature of interest being related to the observable. In one embedment, the analysis engine measures the materiality of the feature of interest to the entity by counting a number of observables from the plurality of observables tagged with the entity identifier.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11989182B2
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Systems and method for dynamically updating materiality distributions and classifications
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T13%3A00%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Hawley,%20James&rft.date=2024-05-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11989182B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true