Sputtering target including carbon-doped GST and method for fabricating electronic device using the same

A sputtering target and a method for fabricating an electronic device using the same are provided. A sputtering target may include a carbon-doped GeSbTe alloy, wherein, for the carbon-doped GeSbTe alloy, an average grain diameter of a GeSbTe alloy after sintering is in a range of 0.5 μm to 5 μm, and...

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Bibliographische Detailangaben
1. Verfasser: Ahn, Jun Ku
Format: Patent
Sprache:eng
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