Integrated vector network analyzer

A method is provided for calibrating a test system, including first and second test instruments. The method includes connecting a first test port of the first test instrument to a second test port of the second test instrument; generating a first RF signal using a first RF source of the first test i...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Anderson, Keith F, Grichener, Alex
Format: Patent
Sprache:eng
Schlagworte:
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