Cross-correlation of metrics for anomaly root cause identification

Technologies are disclosed herein for cross-correlating metrics for anomaly root cause detection. Primary and secondary metrics associated with an anomaly are cross-correlated by first using the derivative of an interpolant of data points of the primary metric to identify a time window for analysis....

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Poole, Maxwell Henry, Sambasivan, Satish, Kaushik, Vivek Siva
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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