Semiconductor device and termination structure

Provided is a highly reliable semiconductor device in which an influence on device characteristics can be reduced while improving a high temperature and high humidity bias resistance of a termination structure (termination region) of a chip by a relatively simple method. The semiconductor device inc...

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Bibliographische Detailangaben
Hauptverfasser: Kato, Yutaka, Shiraishi, Masaki, Oda, Tetsuo, Tokumitsu, Shigeo
Format: Patent
Sprache:eng
Schlagworte:
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