Built-in self-test circuits and semiconductor integrated circuits including the same

A semiconductor integrated circuit includes a digital-to-analog converter and a built-in self-test circuit. The digital-to-analog converter performs a normal conversion operation to generate an analog output signal by converting a digital input signal corresponding to an external digital signal that...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Lee, Heejune, Lee, Sungno, Choi, Michael, Park, Jinwoo, Oh, Eunhye, Cho, Youngjae, Park, Younghyo
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!