Apparatus and method for controlling unit specific junction temperature with high temporal resolution for concurrent central processing unit (CPU) core testing

An apparatus includes a processor configured to control an automatic test equipment (ATE) to measure one or more parameters of a current test instance for testing a device under test (DUT), during execution of the current test instance on the DUT, and determine, based on the measured one or more par...

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Bibliographische Detailangaben

Hauptverfasser:	Ackerman, Christopher Wade, Deshmane, Mahesh, Hales, Jacob, He, Shoujie, Mata Vega, Johnny, Zearing, Joseph
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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