Passive carrier-based device delivery for slot-based high-volume semiconductor test system

A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket oper...

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Bibliographische Detailangaben

Hauptverfasser:	Leventhal, Ira, Ranganathan, Karthik, Oseguera, Gilberto, Kabbani, Samer, Kiyokawa, Toshiyuki, Cruzan, Gregory, Ikeda, Hiroki
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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