Measurement system and method of operating a measurement system

Measurement system and method of operating a measurement system

A measurement system including a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner. The measurement device includes a control circuit. Th...

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Hauptverfasser: Gallhauser, Markus, Voss, Nino, Benisch, Christian, Perndl, Werner
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator Gallhauser, Markus
Voss, Nino
Benisch, Christian
Perndl, Werner
description A measurement system including a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner. The measurement device includes a control circuit. The first probe unit includes an interface module being configured to receive a user input, to generate an input data signal based on the received user input, and to provide the input data signal to the control circuit. The control circuit is configured to generate and provide a control signal at least to the second probe unit based on the input data signal. At least the second probe unit is configured to adjust an operational parameter based on the control signal, wherein the operational parameter relates to a measurement parameter to be measured Moreover, a method for operating a measurement system is disclosed.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Measurement system and method of operating a measurement system
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