Corner guard for improved electroplated first level interconnect bump height range

Embodiments disclosed herein include electronic packages and methods of forming such packages. In an embodiment an electronic package comprises a package substrate, and a first level interconnect (FLI) bump region on the package substrate. In an embodiment, the FLI bump region comprises a plurality...

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Bibliographische Detailangaben
Hauptverfasser: Haehn, Nicholas S, Singh, Antariksh Rao Pratap, Vehonsky, Jacob, Jain, Rahul, Cetegen, Edvin, Cho, Steve S, Heaton, Thomas, Chan Arguedas, Sergio, Ibrahim, Tarek, Neal, Nicholas
Format: Patent
Sprache:eng
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