Automated machine learning test system

A computing device selects new test configurations for testing software. Software under test is executed with first test configurations to generate a test result for each test configuration. Each test configuration includes a value for each test parameter where each test parameter is an input to the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Lin, Yu-Min, Pederson, Bengt Wisen, Gao, Yan, Tan, Pei-Yi, Wright, Raymond Eugene, Tharrington, Jr., Ricky Dee, Griffin, Joshua David
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING PHYSICS
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