Method for removing a particle from a mask system

A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Oshemkov, Sergey, Blumrich, Joerg Frederik, Voelcker, Martin, Wei, Shao-Chi, Scheruebl, Thomas Franz Karl
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Oshemkov, Sergey
Blumrich, Joerg Frederik
Voelcker, Martin
Wei, Shao-Chi
Scheruebl, Thomas Franz Karl
description A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser radiation corresponds to that of used radiation used by the projection exposure apparatus.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11774870B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11774870B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11774870B23</originalsourceid><addsrcrecordid>eNrjZDD0TS3JyE9RSMsvUihKzc0vy8xLV0hUKEgsKslMzklVSCvKzwXycxOLsxWKK4tLUnN5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakl8aLChobm5iYW5gZORMTFqAGyHK3w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for removing a particle from a mask system</title><source>esp@cenet</source><creator>Oshemkov, Sergey ; Blumrich, Joerg Frederik ; Voelcker, Martin ; Wei, Shao-Chi ; Scheruebl, Thomas Franz Karl</creator><creatorcontrib>Oshemkov, Sergey ; Blumrich, Joerg Frederik ; Voelcker, Martin ; Wei, Shao-Chi ; Scheruebl, Thomas Franz Karl</creatorcontrib><description>A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser radiation corresponds to that of used radiation used by the projection exposure apparatus.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231003&amp;DB=EPODOC&amp;CC=US&amp;NR=11774870B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231003&amp;DB=EPODOC&amp;CC=US&amp;NR=11774870B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Oshemkov, Sergey</creatorcontrib><creatorcontrib>Blumrich, Joerg Frederik</creatorcontrib><creatorcontrib>Voelcker, Martin</creatorcontrib><creatorcontrib>Wei, Shao-Chi</creatorcontrib><creatorcontrib>Scheruebl, Thomas Franz Karl</creatorcontrib><title>Method for removing a particle from a mask system</title><description>A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser radiation corresponds to that of used radiation used by the projection exposure apparatus.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD0TS3JyE9RSMsvUihKzc0vy8xLV0hUKEgsKslMzklVSCvKzwXycxOLsxWKK4tLUnN5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakl8aLChobm5iYW5gZORMTFqAGyHK3w</recordid><startdate>20231003</startdate><enddate>20231003</enddate><creator>Oshemkov, Sergey</creator><creator>Blumrich, Joerg Frederik</creator><creator>Voelcker, Martin</creator><creator>Wei, Shao-Chi</creator><creator>Scheruebl, Thomas Franz Karl</creator><scope>EVB</scope></search><sort><creationdate>20231003</creationdate><title>Method for removing a particle from a mask system</title><author>Oshemkov, Sergey ; Blumrich, Joerg Frederik ; Voelcker, Martin ; Wei, Shao-Chi ; Scheruebl, Thomas Franz Karl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11774870B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Oshemkov, Sergey</creatorcontrib><creatorcontrib>Blumrich, Joerg Frederik</creatorcontrib><creatorcontrib>Voelcker, Martin</creatorcontrib><creatorcontrib>Wei, Shao-Chi</creatorcontrib><creatorcontrib>Scheruebl, Thomas Franz Karl</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Oshemkov, Sergey</au><au>Blumrich, Joerg Frederik</au><au>Voelcker, Martin</au><au>Wei, Shao-Chi</au><au>Scheruebl, Thomas Franz Karl</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for removing a particle from a mask system</title><date>2023-10-03</date><risdate>2023</risdate><abstract>A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser radiation corresponds to that of used radiation used by the projection exposure apparatus.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11774870B2
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title Method for removing a particle from a mask system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T03%3A13%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Oshemkov,%20Sergey&rft.date=2023-10-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11774870B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true