Method for removing a particle from a mask system
A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser...
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creator | Oshemkov, Sergey Blumrich, Joerg Frederik Voelcker, Martin Wei, Shao-Chi Scheruebl, Thomas Franz Karl |
description | A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. The wavelength of the laser radiation corresponds to that of used radiation used by the projection exposure apparatus. |
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The wavelength of the laser radiation corresponds to that of used radiation used by the projection exposure apparatus.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD0TS3JyE9RSMsvUihKzc0vy8xLV0hUKEgsKslMzklVSCvKzwXycxOLsxWKK4tLUnN5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakl8aLChobm5iYW5gZORMTFqAGyHK3w</recordid><startdate>20231003</startdate><enddate>20231003</enddate><creator>Oshemkov, Sergey</creator><creator>Blumrich, Joerg Frederik</creator><creator>Voelcker, Martin</creator><creator>Wei, Shao-Chi</creator><creator>Scheruebl, Thomas Franz Karl</creator><scope>EVB</scope></search><sort><creationdate>20231003</creationdate><title>Method for removing a particle from a mask system</title><author>Oshemkov, Sergey ; Blumrich, Joerg Frederik ; Voelcker, Martin ; Wei, Shao-Chi ; Scheruebl, Thomas Franz Karl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11774870B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Oshemkov, Sergey</creatorcontrib><creatorcontrib>Blumrich, Joerg Frederik</creatorcontrib><creatorcontrib>Voelcker, Martin</creatorcontrib><creatorcontrib>Wei, Shao-Chi</creatorcontrib><creatorcontrib>Scheruebl, Thomas Franz Karl</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Oshemkov, Sergey</au><au>Blumrich, Joerg Frederik</au><au>Voelcker, Martin</au><au>Wei, Shao-Chi</au><au>Scheruebl, Thomas Franz Karl</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for removing a particle from a mask system</title><date>2023-10-03</date><risdate>2023</risdate><abstract>A method for removing particles from a mask system for a projection exposure apparatus, including the following method steps: detecting the particle in the mask system, providing laser radiation, and removing the particle by irradiating the particle with laser radiation. 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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS |
title | Method for removing a particle from a mask system |
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