Voltage measurement device, voltage detection circuit, and device address generation method

A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Hatani, Naohisa, Miyake, Jiro
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Hatani, Naohisa
Miyake, Jiro
description A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11754598B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11754598B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11754598B23</originalsourceid><addsrcrecordid>eNqNyzsOwjAQhGE3FAi4w9KHIkAUaEEgeh4NRbSyh2AptiN7k_ODkA9ANcX_zVQ9H6ETbkEOnIYIBy9kMFqNgsbcDARabPCkbdSDlYLYm8yIjYlIiVp4RP4xB3kHM1eTF3cJi7wztTyfbsfLCn1okHrW34c092tZ1tW22u8O680_5gON4zvg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Voltage measurement device, voltage detection circuit, and device address generation method</title><source>esp@cenet</source><creator>Hatani, Naohisa ; Miyake, Jiro</creator><creatorcontrib>Hatani, Naohisa ; Miyake, Jiro</creatorcontrib><description>A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230912&amp;DB=EPODOC&amp;CC=US&amp;NR=11754598B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230912&amp;DB=EPODOC&amp;CC=US&amp;NR=11754598B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hatani, Naohisa</creatorcontrib><creatorcontrib>Miyake, Jiro</creatorcontrib><title>Voltage measurement device, voltage detection circuit, and device address generation method</title><description>A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyzsOwjAQhGE3FAi4w9KHIkAUaEEgeh4NRbSyh2AptiN7k_ODkA9ANcX_zVQ9H6ETbkEOnIYIBy9kMFqNgsbcDARabPCkbdSDlYLYm8yIjYlIiVp4RP4xB3kHM1eTF3cJi7wztTyfbsfLCn1okHrW34c092tZ1tW22u8O680_5gON4zvg</recordid><startdate>20230912</startdate><enddate>20230912</enddate><creator>Hatani, Naohisa</creator><creator>Miyake, Jiro</creator><scope>EVB</scope></search><sort><creationdate>20230912</creationdate><title>Voltage measurement device, voltage detection circuit, and device address generation method</title><author>Hatani, Naohisa ; Miyake, Jiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11754598B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Hatani, Naohisa</creatorcontrib><creatorcontrib>Miyake, Jiro</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hatani, Naohisa</au><au>Miyake, Jiro</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Voltage measurement device, voltage detection circuit, and device address generation method</title><date>2023-09-12</date><risdate>2023</risdate><abstract>A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11754598B2
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY
TESTING
title Voltage measurement device, voltage detection circuit, and device address generation method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T16%3A13%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Hatani,%20Naohisa&rft.date=2023-09-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11754598B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true