Probe substrate and electrical connecting apparatus

An object is to enhance the durability of substrates of a probe substrate and/or the probe substrate and a member to be joined.A probe substrate according to the present disclosure includes: a plurality of electrical contactors respectively brought into electrical contact with a plurality of electro...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Omori, Toshinori, Sugisawa, Takeki, Osanai, Yasuaki, Kondo, Takeshi, Goto, Kazuya, Watanabe, Maki, Akiniwa, Takashi, Abe, Shintaro
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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