Semiconductor device with word line degradation monitor and associated methods and systems

Memory devices, systems including memory devices, and methods of operating memory devices are described, in which memory devices are configured to monitor degradations in word line characteristics. The memory device may generate a reference signal in response to an access command directed to a memor...

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Bibliographische Detailangaben

Hauptverfasser:	Ng, Sue-Fern, Subramaniam, Arunmozhi R, Baghi, Roya, Umesh, Deepika Thumsi, Bell, Debra M, Ghosh, Gitanjali T
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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