Device, system and method to support communication of test, debug or trace information with an external input/output interface

Techniques and mechanisms to exchange test, debug or trace (TDT) information via a general purpose input/output (I/O) interface. In an embodiment, an I/O interface of a device is coupled to an external TDT unit, wherein the I/O interface is compatible with an interconnect standard that supports comm...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Menon, Sankaran M, Eder, Patrik, Kuehnis, Rolf H
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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