Semiconductor integrated circuit and method of testing the same

A test method is provided to test a semiconductor integrated circuit including an analog-to-digital converter and/or a digital-to-analog converter. An analog test signal having a test pattern is generated using an analog test signal generator or a digital test signal having the test pattern using a...

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Bibliographische Detailangaben

Hauptverfasser:	Lee, Heejune, Lee, Sungno, Choi, Michael, Park, Jinwoo, Oh, Eunhye, Shin, Hyochul, Cho, Youngjae, Lee, Yongki, Park, Younghyo
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING
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