System, apparatus and method for functional testing of one or more fabrics of a processor

In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge contro...

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Hauptverfasser:	Adler, Robert P, Pappu, Lakshminarayana, Raja Gopal, R. Selvakumar
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	Adler, Robert P Pappu, Lakshminarayana Raja Gopal, R. Selvakumar
description	In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge controller may be configured to initiate a functional safety test of the at least one fabric in response to a fabric test signal received during functional operation of the apparatus, receive a result of the functional safety test via the at least one status storage, and send to a destination location a test report based on the result. Other embodiments are described and claimed.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11686767B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11686767B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11686767B23</originalsourceid><addsrcrecordid>eNqNijEOwjAMALswIOAPZoehIKXMIBB7YWCqTOpApCaObHfg94DEA5hOurtpdWtfapRWgKWgoI0KmHtIZE_uIbBAGLO3yBkHMFKL-QEcgDPBJyYWgoB3iV6_GqEIe1JlmVeTgIPS4sdZtTwdL4fzmgp3pAU9ZbLu2ta127nGNfvN9p_nDb7kOpE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System, apparatus and method for functional testing of one or more fabrics of a processor</title><source>esp@cenet</source><creator>Adler, Robert P ; Pappu, Lakshminarayana ; Raja Gopal, R. Selvakumar</creator><creatorcontrib>Adler, Robert P ; Pappu, Lakshminarayana ; Raja Gopal, R. Selvakumar</creatorcontrib><description>In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge controller may be configured to initiate a functional safety test of the at least one fabric in response to a fabric test signal received during functional operation of the apparatus, receive a result of the functional safety test via the at least one status storage, and send to a destination location a test report based on the result. Other embodiments are described and claimed.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230627&DB=EPODOC&CC=US&NR=11686767B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,782,887,25573,76557</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230627&DB=EPODOC&CC=US&NR=11686767B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Adler, Robert P</creatorcontrib><creatorcontrib>Pappu, Lakshminarayana</creatorcontrib><creatorcontrib>Raja Gopal, R. Selvakumar</creatorcontrib><title>System, apparatus and method for functional testing of one or more fabrics of a processor</title><description>In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge controller may be configured to initiate a functional safety test of the at least one fabric in response to a fabric test signal received during functional operation of the apparatus, receive a result of the functional safety test via the at least one status storage, and send to a destination location a test report based on the result. Other embodiments are described and claimed.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEOwjAMALswIOAPZoehIKXMIBB7YWCqTOpApCaObHfg94DEA5hOurtpdWtfapRWgKWgoI0KmHtIZE_uIbBAGLO3yBkHMFKL-QEcgDPBJyYWgoB3iV6_GqEIe1JlmVeTgIPS4sdZtTwdL4fzmgp3pAU9ZbLu2ta127nGNfvN9p_nDb7kOpE</recordid><startdate>20230627</startdate><enddate>20230627</enddate><creator>Adler, Robert P</creator><creator>Pappu, Lakshminarayana</creator><creator>Raja Gopal, R. Selvakumar</creator><scope>EVB</scope></search><sort><creationdate>20230627</creationdate><title>System, apparatus and method for functional testing of one or more fabrics of a processor</title><author>Adler, Robert P ; Pappu, Lakshminarayana ; Raja Gopal, R. Selvakumar</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11686767B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Adler, Robert P</creatorcontrib><creatorcontrib>Pappu, Lakshminarayana</creatorcontrib><creatorcontrib>Raja Gopal, R. Selvakumar</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Adler, Robert P</au><au>Pappu, Lakshminarayana</au><au>Raja Gopal, R. Selvakumar</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System, apparatus and method for functional testing of one or more fabrics of a processor</title><date>2023-06-27</date><risdate>2023</risdate><abstract>In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge controller may be configured to initiate a functional safety test of the at least one fabric in response to a fabric test signal received during functional operation of the apparatus, receive a result of the functional safety test via the at least one status storage, and send to a destination location a test report based on the result. Other embodiments are described and claimed.</abstract><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	System, apparatus and method for functional testing of one or more fabrics of a processor
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-03T16%3A35%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Adler,%20Robert%20P&rft.date=2023-06-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11686767B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true