Integrated circuit having an in-situ circuit for detecting an impending circuit failure

A critical data path of an integrated circuit includes a flip flop configured to receive a data input and provide a latched data output. A monitoring circuit includes a delay generator configured to receive the data input and provide a plurality of delayed data outputs corresponding to delayed versi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tipple, David Russell, Onyema, Emmanuel Chukwuma, Jarrar, Anis Mahmoud
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING
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