Semiconductor device and method of manufacturing semiconductor device

A semiconductor device includes a first insulating layer disposed on a substrate, a first wiring disposed in the first insulating layer, a first insulating barrier layer disposed on the first insulating layer, an etch-stop layer disposed on the first insulating barrier layer and having an area small...

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Bibliographische Detailangaben
Hauptverfasser: You, Wookyung, Jung, Deokyoung, Park, Kyeongbeom, Park, Sungbin, Lee, Jangho, Lim, Seonghun, Baek, Jongmin, Park, Suhyun, Han, Kyuhee
Format: Patent
Sprache:eng
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Zusammenfassung:A semiconductor device includes a first insulating layer disposed on a substrate, a first wiring disposed in the first insulating layer, a first insulating barrier layer disposed on the first insulating layer, an etch-stop layer disposed on the first insulating barrier layer and having an area smaller than an area of the first insulating barrier layer in a plan view, a resistive metal pattern disposed on the etch-stop layer, a second insulating barrier layer disposed on the resistive metal pattern, a second insulating layer covering the first and second insulating barrier layers, a second wiring disposed in the second insulating layer, and a first conductive via disposed between the resistive metal pattern and the second wiring to penetrate through the second insulating barrier layer and the second insulating layer and electrically connect the resistive metal pattern and the second wiring.