Traceable in-situ micro- and nano-indentation testing instrument and method under variable temperature conditions

The present disclosure relates to a traceable in-situ micro- and nano-indentation testing instrument and method under variable temperature conditions. A macro-micro switchable mechanical loading module, a nano mechanical loading module and an indentation position optical positioning module are fixed...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Li, Honglong, Wang, Zhaoxin, Zhang, Jianhai, Wang, Shunbo, Wang, Jiru, Zhao, Hongwei, Zong, Xiangyu, Liu, Peng, Li, Cong, Zhou, Shuilong, Wang, Wenyang, Zhang, Meng
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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