Three-dimensional shape measuring method and three-dimensional shape measuring device

A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a second grid pattern based on a second light onto a target object in such a way that the first grid pattern and the second grid pattern intersect each other, the first light and the secon...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Hasegawa, Hiroshi, Horiguchi, Hirosada, Narimatsu, Shuji
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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