Systems and methods for measuring and validating key performance indicators generated by machine learning models
A device may receive, from a customer platform, customer event data identifying events occurring between customers and an entity, and may receive, from the customer platform, customer action data generated by machine learning models and identifying customer actions to be taken by the customer platfo...
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creator | Russo, John Ganesh, Vinod Khanna Saini Bedse, Pritam Muthusamy, Senthil Sharma, Rajat Chitti, Rishi Kanth Arrekuti, Khagender Mishra, Sailesh K Kamalapuram, Pavani Krishnamurthy, Srinivasan McLaren, Travis R |
description | A device may receive, from a customer platform, customer event data identifying events occurring between customers and an entity, and may receive, from the customer platform, customer action data generated by machine learning models and identifying customer actions to be taken by the customer platform in response to the occurrence of the events. The device may receive, from the customer platform, customer results data identifying results of the customer actions taken by the customer platform, and may calculate current key performance indicators based on the customer event data, the customer action data, and the customer results data. The device may retrain one or more of the machine learning models based on the current key performance indicators to generate one or more retrained machine learning models, and may provide the one or more retrained machine learning models to the customer platform. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11605022B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11605022B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11605022B23</originalsourceid><addsrcrecordid>eNqNjE0KwkAUg7txIeodngcQ2ooeQFHcV9flOZPawflj3ij09rbiAVwlIV8yL2IzSIYTYq_JIfdBC3UhjZ7llYx_fJs3W6M5T_GJgSLSyDj2CmS8NopzSEIPeCTO0HQfyLHqjQdZcPLT0AUNK8ti1rEVrH66KNbn0_V42SCGFhJZjSe5vTVVtS93ZV0f6u0_zAej5UPy</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Systems and methods for measuring and validating key performance indicators generated by machine learning models</title><source>esp@cenet</source><creator>Russo, John ; Ganesh, Vinod Khanna Saini ; Bedse, Pritam ; Muthusamy, Senthil ; Sharma, Rajat ; Chitti, Rishi Kanth ; Arrekuti, Khagender ; Mishra, Sailesh K ; Kamalapuram, Pavani ; Krishnamurthy, Srinivasan ; McLaren, Travis R</creator><creatorcontrib>Russo, John ; Ganesh, Vinod Khanna Saini ; Bedse, Pritam ; Muthusamy, Senthil ; Sharma, Rajat ; Chitti, Rishi Kanth ; Arrekuti, Khagender ; Mishra, Sailesh K ; Kamalapuram, Pavani ; Krishnamurthy, Srinivasan ; McLaren, Travis R</creatorcontrib><description>A device may receive, from a customer platform, customer event data identifying events occurring between customers and an entity, and may receive, from the customer platform, customer action data generated by machine learning models and identifying customer actions to be taken by the customer platform in response to the occurrence of the events. The device may receive, from the customer platform, customer results data identifying results of the customer actions taken by the customer platform, and may calculate current key performance indicators based on the customer event data, the customer action data, and the customer results data. The device may retrain one or more of the machine learning models based on the current key performance indicators to generate one or more retrained machine learning models, and may provide the one or more retrained machine learning models to the customer platform.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230314&DB=EPODOC&CC=US&NR=11605022B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230314&DB=EPODOC&CC=US&NR=11605022B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Russo, John</creatorcontrib><creatorcontrib>Ganesh, Vinod Khanna Saini</creatorcontrib><creatorcontrib>Bedse, Pritam</creatorcontrib><creatorcontrib>Muthusamy, Senthil</creatorcontrib><creatorcontrib>Sharma, Rajat</creatorcontrib><creatorcontrib>Chitti, Rishi Kanth</creatorcontrib><creatorcontrib>Arrekuti, Khagender</creatorcontrib><creatorcontrib>Mishra, Sailesh K</creatorcontrib><creatorcontrib>Kamalapuram, Pavani</creatorcontrib><creatorcontrib>Krishnamurthy, Srinivasan</creatorcontrib><creatorcontrib>McLaren, Travis R</creatorcontrib><title>Systems and methods for measuring and validating key performance indicators generated by machine learning models</title><description>A device may receive, from a customer platform, customer event data identifying events occurring between customers and an entity, and may receive, from the customer platform, customer action data generated by machine learning models and identifying customer actions to be taken by the customer platform in response to the occurrence of the events. The device may receive, from the customer platform, customer results data identifying results of the customer actions taken by the customer platform, and may calculate current key performance indicators based on the customer event data, the customer action data, and the customer results data. The device may retrain one or more of the machine learning models based on the current key performance indicators to generate one or more retrained machine learning models, and may provide the one or more retrained machine learning models to the customer platform.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjE0KwkAUg7txIeodngcQ2ooeQFHcV9flOZPawflj3ij09rbiAVwlIV8yL2IzSIYTYq_JIfdBC3UhjZ7llYx_fJs3W6M5T_GJgSLSyDj2CmS8NopzSEIPeCTO0HQfyLHqjQdZcPLT0AUNK8ti1rEVrH66KNbn0_V42SCGFhJZjSe5vTVVtS93ZV0f6u0_zAej5UPy</recordid><startdate>20230314</startdate><enddate>20230314</enddate><creator>Russo, John</creator><creator>Ganesh, Vinod Khanna Saini</creator><creator>Bedse, Pritam</creator><creator>Muthusamy, Senthil</creator><creator>Sharma, Rajat</creator><creator>Chitti, Rishi Kanth</creator><creator>Arrekuti, Khagender</creator><creator>Mishra, Sailesh K</creator><creator>Kamalapuram, Pavani</creator><creator>Krishnamurthy, Srinivasan</creator><creator>McLaren, Travis R</creator><scope>EVB</scope></search><sort><creationdate>20230314</creationdate><title>Systems and methods for measuring and validating key performance indicators generated by machine learning models</title><author>Russo, John ; Ganesh, Vinod Khanna Saini ; Bedse, Pritam ; Muthusamy, Senthil ; Sharma, Rajat ; Chitti, Rishi Kanth ; Arrekuti, Khagender ; Mishra, Sailesh K ; Kamalapuram, Pavani ; Krishnamurthy, Srinivasan ; McLaren, Travis R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11605022B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Russo, John</creatorcontrib><creatorcontrib>Ganesh, Vinod Khanna Saini</creatorcontrib><creatorcontrib>Bedse, Pritam</creatorcontrib><creatorcontrib>Muthusamy, Senthil</creatorcontrib><creatorcontrib>Sharma, Rajat</creatorcontrib><creatorcontrib>Chitti, Rishi Kanth</creatorcontrib><creatorcontrib>Arrekuti, Khagender</creatorcontrib><creatorcontrib>Mishra, Sailesh K</creatorcontrib><creatorcontrib>Kamalapuram, Pavani</creatorcontrib><creatorcontrib>Krishnamurthy, Srinivasan</creatorcontrib><creatorcontrib>McLaren, Travis R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Russo, John</au><au>Ganesh, Vinod Khanna Saini</au><au>Bedse, Pritam</au><au>Muthusamy, Senthil</au><au>Sharma, Rajat</au><au>Chitti, Rishi Kanth</au><au>Arrekuti, Khagender</au><au>Mishra, Sailesh K</au><au>Kamalapuram, Pavani</au><au>Krishnamurthy, Srinivasan</au><au>McLaren, Travis R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Systems and methods for measuring and validating key performance indicators generated by machine learning models</title><date>2023-03-14</date><risdate>2023</risdate><abstract>A device may receive, from a customer platform, customer event data identifying events occurring between customers and an entity, and may receive, from the customer platform, customer action data generated by machine learning models and identifying customer actions to be taken by the customer platform in response to the occurrence of the events. The device may receive, from the customer platform, customer results data identifying results of the customer actions taken by the customer platform, and may calculate current key performance indicators based on the customer event data, the customer action data, and the customer results data. The device may retrain one or more of the machine learning models based on the current key performance indicators to generate one or more retrained machine learning models, and may provide the one or more retrained machine learning models to the customer platform.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
title | Systems and methods for measuring and validating key performance indicators generated by machine learning models |
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