Field programmable gate array (FPGA) for improving reliability of key configuration bitstream by reusing buffer memory

A field programmable gate array (FPGA) for improving the reliability of a key configuration bitstream by reusing a buffer memory includes a configuration buffer, a configuration memory and a control circuit. The configuration memory includes N configuration blocks. The FPGA stores a key configuratio...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Xu, Yanfeng, Hui, Feng, Ji, Zhenkai, Shan, Yueer
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Xu, Yanfeng
Hui, Feng
Ji, Zhenkai
Shan, Yueer
description A field programmable gate array (FPGA) for improving the reliability of a key configuration bitstream by reusing a buffer memory includes a configuration buffer, a configuration memory and a control circuit. The configuration memory includes N configuration blocks. The FPGA stores a key configuration chain by using the configuration buffer and ensures correct content of the key configuration chain through an error correcting code (ECC) check function of the configuration buffer, so that when the FPGA runs normally, a control circuit reads the key configuration chain in the configuration buffer at an interval of a predetermined time and writes the key configuration chain into a corresponding configuration block to update the key configuration chain, thereby ensuring accuracy of the content of the key configuration chain and improving running reliability of the FPGA.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11604696B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11604696B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11604696B23</originalsourceid><addsrcrecordid>eNqNyz0KwkAQQOE0FqLeYey0EIxKwFLFaCmodZiNs2Fwf8LsJrC3N4IHsHrN98ZZXzKZF7TiG0FrURmCBiMBimCCRXm7HJagvQDbAfXsGhAyjIoNxwRew5sS1N5pbjrByN6B4hiiEFpQadBd-F6q05oELFkvaZqNNJpAs18n2bw8P07XFbW-otBiTY5i9bznebHeFfviuNn-Yz7WEkWH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Field programmable gate array (FPGA) for improving reliability of key configuration bitstream by reusing buffer memory</title><source>esp@cenet</source><creator>Xu, Yanfeng ; Hui, Feng ; Ji, Zhenkai ; Shan, Yueer</creator><creatorcontrib>Xu, Yanfeng ; Hui, Feng ; Ji, Zhenkai ; Shan, Yueer</creatorcontrib><description>A field programmable gate array (FPGA) for improving the reliability of a key configuration bitstream by reusing a buffer memory includes a configuration buffer, a configuration memory and a control circuit. The configuration memory includes N configuration blocks. The FPGA stores a key configuration chain by using the configuration buffer and ensures correct content of the key configuration chain through an error correcting code (ECC) check function of the configuration buffer, so that when the FPGA runs normally, a control circuit reads the key configuration chain in the configuration buffer at an interval of a predetermined time and writes the key configuration chain into a corresponding configuration block to update the key configuration chain, thereby ensuring accuracy of the content of the key configuration chain and improving running reliability of the FPGA.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230314&amp;DB=EPODOC&amp;CC=US&amp;NR=11604696B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230314&amp;DB=EPODOC&amp;CC=US&amp;NR=11604696B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Xu, Yanfeng</creatorcontrib><creatorcontrib>Hui, Feng</creatorcontrib><creatorcontrib>Ji, Zhenkai</creatorcontrib><creatorcontrib>Shan, Yueer</creatorcontrib><title>Field programmable gate array (FPGA) for improving reliability of key configuration bitstream by reusing buffer memory</title><description>A field programmable gate array (FPGA) for improving the reliability of a key configuration bitstream by reusing a buffer memory includes a configuration buffer, a configuration memory and a control circuit. The configuration memory includes N configuration blocks. The FPGA stores a key configuration chain by using the configuration buffer and ensures correct content of the key configuration chain through an error correcting code (ECC) check function of the configuration buffer, so that when the FPGA runs normally, a control circuit reads the key configuration chain in the configuration buffer at an interval of a predetermined time and writes the key configuration chain into a corresponding configuration block to update the key configuration chain, thereby ensuring accuracy of the content of the key configuration chain and improving running reliability of the FPGA.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyz0KwkAQQOE0FqLeYey0EIxKwFLFaCmodZiNs2Fwf8LsJrC3N4IHsHrN98ZZXzKZF7TiG0FrURmCBiMBimCCRXm7HJagvQDbAfXsGhAyjIoNxwRew5sS1N5pbjrByN6B4hiiEFpQadBd-F6q05oELFkvaZqNNJpAs18n2bw8P07XFbW-otBiTY5i9bznebHeFfviuNn-Yz7WEkWH</recordid><startdate>20230314</startdate><enddate>20230314</enddate><creator>Xu, Yanfeng</creator><creator>Hui, Feng</creator><creator>Ji, Zhenkai</creator><creator>Shan, Yueer</creator><scope>EVB</scope></search><sort><creationdate>20230314</creationdate><title>Field programmable gate array (FPGA) for improving reliability of key configuration bitstream by reusing buffer memory</title><author>Xu, Yanfeng ; Hui, Feng ; Ji, Zhenkai ; Shan, Yueer</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11604696B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Xu, Yanfeng</creatorcontrib><creatorcontrib>Hui, Feng</creatorcontrib><creatorcontrib>Ji, Zhenkai</creatorcontrib><creatorcontrib>Shan, Yueer</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Xu, Yanfeng</au><au>Hui, Feng</au><au>Ji, Zhenkai</au><au>Shan, Yueer</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Field programmable gate array (FPGA) for improving reliability of key configuration bitstream by reusing buffer memory</title><date>2023-03-14</date><risdate>2023</risdate><abstract>A field programmable gate array (FPGA) for improving the reliability of a key configuration bitstream by reusing a buffer memory includes a configuration buffer, a configuration memory and a control circuit. The configuration memory includes N configuration blocks. The FPGA stores a key configuration chain by using the configuration buffer and ensures correct content of the key configuration chain through an error correcting code (ECC) check function of the configuration buffer, so that when the FPGA runs normally, a control circuit reads the key configuration chain in the configuration buffer at an interval of a predetermined time and writes the key configuration chain into a corresponding configuration block to update the key configuration chain, thereby ensuring accuracy of the content of the key configuration chain and improving running reliability of the FPGA.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11604696B2
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Field programmable gate array (FPGA) for improving reliability of key configuration bitstream by reusing buffer memory
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T04%3A14%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Xu,%20Yanfeng&rft.date=2023-03-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11604696B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true