Forming a homogenized illumination line which can be imaged as a low-speckle line
A system for forming a homogenized illumination line which can be imaged as a low-speckle line is disclosed. The system includes a laser configured to emit a collimated laser beam; and an illumination-fan generator that includes one or more linear diffusers. The illumination-fan generator is arrange...
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creator | Belanger, Laurent Parrett, Andrew Goodale, Andrew Zimmerman, Ronald Filhaber, John F |
description | A system for forming a homogenized illumination line which can be imaged as a low-speckle line is disclosed. The system includes a laser configured to emit a collimated laser beam; and an illumination-fan generator that includes one or more linear diffusers. The illumination-fan generator is arranged and configured to (i) receive the collimated laser beam, (ii) output a planar fan of diffused light, such that the planar fan emanates from a light line formed on the distal-most one of the one or more linear diffusers, and (iii) cause formation of an illumination line at an intersection of the planar fan and an object. |
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The system includes a laser configured to emit a collimated laser beam; and an illumination-fan generator that includes one or more linear diffusers. The illumination-fan generator is arranged and configured to (i) receive the collimated laser beam, (ii) output a planar fan of diffused light, such that the planar fan emanates from a light line formed on the distal-most one of the one or more linear diffusers, and (iii) cause formation of an illumination line at an intersection of the planar fan and an object.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230307&DB=EPODOC&CC=US&NR=11598973B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230307&DB=EPODOC&CC=US&NR=11598973B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Belanger, Laurent</creatorcontrib><creatorcontrib>Parrett, Andrew</creatorcontrib><creatorcontrib>Goodale, Andrew</creatorcontrib><creatorcontrib>Zimmerman, Ronald</creatorcontrib><creatorcontrib>Filhaber, John F</creatorcontrib><title>Forming a homogenized illumination line which can be imaged as a low-speckle line</title><description>A system for forming a homogenized illumination line which can be imaged as a low-speckle line is disclosed. 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The illumination-fan generator is arranged and configured to (i) receive the collimated laser beam, (ii) output a planar fan of diffused light, such that the planar fan emanates from a light line formed on the distal-most one of the one or more linear diffusers, and (iii) cause formation of an illumination line at an intersection of the planar fan and an object.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAh0yy_KzcxLV0hUyMjPzU9PzcusSk1RyMzJKQUKJ5Zk5ucp5GTmpSqUZ2QmZygkJ-YpJKUqZOYmpgNVJRYDteXkl-sWF6QmZ-ekglXyMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JL40GBDQ1NLC0tzYycjY2LUAACWujdB</recordid><startdate>20230307</startdate><enddate>20230307</enddate><creator>Belanger, Laurent</creator><creator>Parrett, Andrew</creator><creator>Goodale, Andrew</creator><creator>Zimmerman, Ronald</creator><creator>Filhaber, John F</creator><scope>EVB</scope></search><sort><creationdate>20230307</creationdate><title>Forming a homogenized illumination line which can be imaged as a low-speckle line</title><author>Belanger, Laurent ; Parrett, Andrew ; Goodale, Andrew ; Zimmerman, Ronald ; Filhaber, John F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11598973B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Belanger, Laurent</creatorcontrib><creatorcontrib>Parrett, Andrew</creatorcontrib><creatorcontrib>Goodale, Andrew</creatorcontrib><creatorcontrib>Zimmerman, Ronald</creatorcontrib><creatorcontrib>Filhaber, John F</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Belanger, Laurent</au><au>Parrett, Andrew</au><au>Goodale, Andrew</au><au>Zimmerman, Ronald</au><au>Filhaber, John F</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Forming a homogenized illumination line which can be imaged as a low-speckle line</title><date>2023-03-07</date><risdate>2023</risdate><abstract>A system for forming a homogenized illumination line which can be imaged as a low-speckle line is disclosed. The system includes a laser configured to emit a collimated laser beam; and an illumination-fan generator that includes one or more linear diffusers. The illumination-fan generator is arranged and configured to (i) receive the collimated laser beam, (ii) output a planar fan of diffused light, such that the planar fan emanates from a light line formed on the distal-most one of the one or more linear diffusers, and (iii) cause formation of an illumination line at an intersection of the planar fan and an object.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
title | Forming a homogenized illumination line which can be imaged as a low-speckle line |
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