Apparatus state estimation device, apparatus state estimation method and program

A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Aoyama, Kuniaki, Kaneko, Hideaki, Abe, Katsuhiko, Tomita, Yasuoki, Nomura, Masumi
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Aoyama, Kuniaki
Kaneko, Hideaki
Abe, Katsuhiko
Tomita, Yasuoki
Nomura, Masumi
description A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11566983B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11566983B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11566983B23</originalsourceid><addsrcrecordid>eNrjZAhwLChILEosKS1WKC5JLElVSC0uycxNLMnMz1NISS3LTE7VUUjErSQ3tSQjP0UhMS9FoaAoP70oMZeHgTUtMac4lRdKczMourmGOHvophbkx6cWFyQmp-allsSHBhsampqZWVoYOxkZE6MGAOu1OB8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus state estimation device, apparatus state estimation method and program</title><source>esp@cenet</source><creator>Aoyama, Kuniaki ; Kaneko, Hideaki ; Abe, Katsuhiko ; Tomita, Yasuoki ; Nomura, Masumi</creator><creatorcontrib>Aoyama, Kuniaki ; Kaneko, Hideaki ; Abe, Katsuhiko ; Tomita, Yasuoki ; Nomura, Masumi</creatorcontrib><description>A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230131&amp;DB=EPODOC&amp;CC=US&amp;NR=11566983B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230131&amp;DB=EPODOC&amp;CC=US&amp;NR=11566983B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Aoyama, Kuniaki</creatorcontrib><creatorcontrib>Kaneko, Hideaki</creatorcontrib><creatorcontrib>Abe, Katsuhiko</creatorcontrib><creatorcontrib>Tomita, Yasuoki</creatorcontrib><creatorcontrib>Nomura, Masumi</creatorcontrib><title>Apparatus state estimation device, apparatus state estimation method and program</title><description>A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAhwLChILEosKS1WKC5JLElVSC0uycxNLMnMz1NISS3LTE7VUUjErSQ3tSQjP0UhMS9FoaAoP70oMZeHgTUtMac4lRdKczMourmGOHvophbkx6cWFyQmp-allsSHBhsampqZWVoYOxkZE6MGAOu1OB8</recordid><startdate>20230131</startdate><enddate>20230131</enddate><creator>Aoyama, Kuniaki</creator><creator>Kaneko, Hideaki</creator><creator>Abe, Katsuhiko</creator><creator>Tomita, Yasuoki</creator><creator>Nomura, Masumi</creator><scope>EVB</scope></search><sort><creationdate>20230131</creationdate><title>Apparatus state estimation device, apparatus state estimation method and program</title><author>Aoyama, Kuniaki ; Kaneko, Hideaki ; Abe, Katsuhiko ; Tomita, Yasuoki ; Nomura, Masumi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11566983B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Aoyama, Kuniaki</creatorcontrib><creatorcontrib>Kaneko, Hideaki</creatorcontrib><creatorcontrib>Abe, Katsuhiko</creatorcontrib><creatorcontrib>Tomita, Yasuoki</creatorcontrib><creatorcontrib>Nomura, Masumi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Aoyama, Kuniaki</au><au>Kaneko, Hideaki</au><au>Abe, Katsuhiko</au><au>Tomita, Yasuoki</au><au>Nomura, Masumi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus state estimation device, apparatus state estimation method and program</title><date>2023-01-31</date><risdate>2023</risdate><abstract>A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11566983B2
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Apparatus state estimation device, apparatus state estimation method and program
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T23%3A42%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Aoyama,%20Kuniaki&rft.date=2023-01-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11566983B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true