Method for full-field measurement using dynamic laser doppler imaging

A method for full-field measurement using Doppler imaging, comprising the following steps: turning on a laser and adjusting the laser; adjusting a spatial filter to obtain circular laser spots having uniform intensity distribution; adjusting a quarter-wave plate and a whole polarizer in a system, an...

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Hauptverfasser: Yang, Shanwei, Feng, Qibo, Wang, Xu, Gao, Chenjia, Gao, Zhan, Qin, Jie, Wang, Shengjia
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creator Yang, Shanwei
Feng, Qibo
Wang, Xu
Gao, Chenjia
Gao, Zhan
Qin, Jie
Wang, Shengjia
description A method for full-field measurement using Doppler imaging, comprising the following steps: turning on a laser and adjusting the laser; adjusting a spatial filter to obtain circular laser spots having uniform intensity distribution; adjusting a quarter-wave plate and a whole polarizer in a system, and requiring two beams in a reference object and a measured object having different frequencies and perpendicular polarization directions; applying slight pressure to the measured object, setting a charge coupled device (CCD) camera into a continuous acquisition mode, observing interference fringes, and adjusting a light path so that the fringes are clear and visible; setting the sampling frequency, sampling time, captured image format and resolution size of the CCD camera; turning on a lithium niobate crystal drive power switch to produce a heterodyne carrier frequency; applying continuous equal pushing force to the measured object by means of piezoelectric ceramics (PZT) so as to make the measured object produce continuous bending deformation; controlling the CCD camera to sample using a computer, and collecting a set of time series light interference images along with the continuous deformation of the measured object; and processing the time series light intensity interference image to obtain a three-dimensional data module comprising continuous deformation of the measured objects distributed in time and space.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11561081B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11561081B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11561081B23</originalsourceid><addsrcrecordid>eNrjZHD1TS3JyE9RSMsvUkgrzcnRTctMzUlRyE1NLC4tSs1NzStRKC3OzEtXSKnMS8zNTFbISSxOLVJIyS8oyAHSmbmJ6UBZHgbWtMSc4lReKM3NoOjmGuLsoZtakB-fWlyQmJyal1oSHxpsaGhqZmhgYehkZEyMGgABlTN0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for full-field measurement using dynamic laser doppler imaging</title><source>esp@cenet</source><creator>Yang, Shanwei ; Feng, Qibo ; Wang, Xu ; Gao, Chenjia ; Gao, Zhan ; Qin, Jie ; Wang, Shengjia</creator><creatorcontrib>Yang, Shanwei ; Feng, Qibo ; Wang, Xu ; Gao, Chenjia ; Gao, Zhan ; Qin, Jie ; Wang, Shengjia</creatorcontrib><description>A method for full-field measurement using Doppler imaging, comprising the following steps: turning on a laser and adjusting the laser; adjusting a spatial filter to obtain circular laser spots having uniform intensity distribution; adjusting a quarter-wave plate and a whole polarizer in a system, and requiring two beams in a reference object and a measured object having different frequencies and perpendicular polarization directions; applying slight pressure to the measured object, setting a charge coupled device (CCD) camera into a continuous acquisition mode, observing interference fringes, and adjusting a light path so that the fringes are clear and visible; setting the sampling frequency, sampling time, captured image format and resolution size of the CCD camera; turning on a lithium niobate crystal drive power switch to produce a heterodyne carrier frequency; applying continuous equal pushing force to the measured object by means of piezoelectric ceramics (PZT) so as to make the measured object produce continuous bending deformation; controlling the CCD camera to sample using a computer, and collecting a set of time series light interference images along with the continuous deformation of the measured object; and processing the time series light intensity interference image to obtain a three-dimensional data module comprising continuous deformation of the measured objects distributed in time and space.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230124&amp;DB=EPODOC&amp;CC=US&amp;NR=11561081B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230124&amp;DB=EPODOC&amp;CC=US&amp;NR=11561081B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Yang, Shanwei</creatorcontrib><creatorcontrib>Feng, Qibo</creatorcontrib><creatorcontrib>Wang, Xu</creatorcontrib><creatorcontrib>Gao, Chenjia</creatorcontrib><creatorcontrib>Gao, Zhan</creatorcontrib><creatorcontrib>Qin, Jie</creatorcontrib><creatorcontrib>Wang, Shengjia</creatorcontrib><title>Method for full-field measurement using dynamic laser doppler imaging</title><description>A method for full-field measurement using Doppler imaging, comprising the following steps: turning on a laser and adjusting the laser; adjusting a spatial filter to obtain circular laser spots having uniform intensity distribution; adjusting a quarter-wave plate and a whole polarizer in a system, and requiring two beams in a reference object and a measured object having different frequencies and perpendicular polarization directions; applying slight pressure to the measured object, setting a charge coupled device (CCD) camera into a continuous acquisition mode, observing interference fringes, and adjusting a light path so that the fringes are clear and visible; setting the sampling frequency, sampling time, captured image format and resolution size of the CCD camera; turning on a lithium niobate crystal drive power switch to produce a heterodyne carrier frequency; applying continuous equal pushing force to the measured object by means of piezoelectric ceramics (PZT) so as to make the measured object produce continuous bending deformation; controlling the CCD camera to sample using a computer, and collecting a set of time series light interference images along with the continuous deformation of the measured object; and processing the time series light intensity interference image to obtain a three-dimensional data module comprising continuous deformation of the measured objects distributed in time and space.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DEVICES USING STIMULATED EMISSION</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD1TS3JyE9RSMsvUkgrzcnRTctMzUlRyE1NLC4tSs1NzStRKC3OzEtXSKnMS8zNTFbISSxOLVJIyS8oyAHSmbmJ6UBZHgbWtMSc4lReKM3NoOjmGuLsoZtakB-fWlyQmJyal1oSHxpsaGhqZmhgYehkZEyMGgABlTN0</recordid><startdate>20230124</startdate><enddate>20230124</enddate><creator>Yang, Shanwei</creator><creator>Feng, Qibo</creator><creator>Wang, Xu</creator><creator>Gao, Chenjia</creator><creator>Gao, Zhan</creator><creator>Qin, Jie</creator><creator>Wang, Shengjia</creator><scope>EVB</scope></search><sort><creationdate>20230124</creationdate><title>Method for full-field measurement using dynamic laser doppler imaging</title><author>Yang, Shanwei ; Feng, Qibo ; Wang, Xu ; Gao, Chenjia ; Gao, Zhan ; Qin, Jie ; Wang, Shengjia</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11561081B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DEVICES USING STIMULATED EMISSION</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Yang, Shanwei</creatorcontrib><creatorcontrib>Feng, Qibo</creatorcontrib><creatorcontrib>Wang, Xu</creatorcontrib><creatorcontrib>Gao, Chenjia</creatorcontrib><creatorcontrib>Gao, Zhan</creatorcontrib><creatorcontrib>Qin, Jie</creatorcontrib><creatorcontrib>Wang, Shengjia</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yang, Shanwei</au><au>Feng, Qibo</au><au>Wang, Xu</au><au>Gao, Chenjia</au><au>Gao, Zhan</au><au>Qin, Jie</au><au>Wang, Shengjia</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for full-field measurement using dynamic laser doppler imaging</title><date>2023-01-24</date><risdate>2023</risdate><abstract>A method for full-field measurement using Doppler imaging, comprising the following steps: turning on a laser and adjusting the laser; adjusting a spatial filter to obtain circular laser spots having uniform intensity distribution; adjusting a quarter-wave plate and a whole polarizer in a system, and requiring two beams in a reference object and a measured object having different frequencies and perpendicular polarization directions; applying slight pressure to the measured object, setting a charge coupled device (CCD) camera into a continuous acquisition mode, observing interference fringes, and adjusting a light path so that the fringes are clear and visible; setting the sampling frequency, sampling time, captured image format and resolution size of the CCD camera; turning on a lithium niobate crystal drive power switch to produce a heterodyne carrier frequency; applying continuous equal pushing force to the measured object by means of piezoelectric ceramics (PZT) so as to make the measured object produce continuous bending deformation; controlling the CCD camera to sample using a computer, and collecting a set of time series light interference images along with the continuous deformation of the measured object; and processing the time series light intensity interference image to obtain a three-dimensional data module comprising continuous deformation of the measured objects distributed in time and space.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Method for full-field measurement using dynamic laser doppler imaging
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T06%3A52%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Yang,%20Shanwei&rft.date=2023-01-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11561081B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true