Cantilever-type probe with multiple metallic coatings

A cantilever-type probe with multiple metallic coatings is disclosed. The cantilever-type probe includes at least one probe pin. A first metallic coating is disposed upon a tip of the probe pin, and a second metallic coating is disposed upon a root of the probe pin. The second metallic coating is in...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	You, Hai-Yang, Zou, Hongshuo, Zhu, Nanchang
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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