Accurate and model-based measurement and management systems and methods

Systems and methods for measurement and management are disclosed that provide complex measurements cost-effectively at very high accuracy. These methods and systems in some cases achieve measurement accuracy exceeding the accuracy of the reference standards they rely on, and eliminate expensive and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Cromarty, Andrew S, Levoy, Jasen, Peterson, Donald J, Calhoun, William Charles
Format: Patent
Sprache:eng
Schlagworte:
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