Testing device and method

Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Hsieh, Cheng-Tsai, Chen, Cheng-Shao, Hsiao, Po-Wen, Liang, Wen-Chin
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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