Detection system

System and method for detecting the presence at a distance of materials utilizing the atomic structure and characteristics of the elements in the chemicals comprising the material.

Bibliographische Detailangaben

Hauptverfasser:	Perez, Axel James, Wilson, Richard D, Duke, Dennis
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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