Apparatus and method for quantitative characterization of a light detector

Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Ilkov, Fedor, Bhaban, Shreyas
Format: Patent
Sprache:eng
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