Method and apparatus for imaging analysis of a switchgear or the like
A method is disclosed for inspecting electrical components within a housing. The method may be useful for identifying dust, grime, corrosion, tree-like structures, edges and/or slots on electrical components. The method includes capturing two optical images of an electrical component and comparing t...
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| creator | Cole, Gregory A Wang, Jianjun Rossano, Gregory F Kozel, Tomas |
| description | A method is disclosed for inspecting electrical components within a housing. The method may be useful for identifying dust, grime, corrosion, tree-like structures, edges and/or slots on electrical components. The method includes capturing two optical images of an electrical component and comparing the images. Variations in pixels between the two images may be used to generate warnings. |
| format | Patent |
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The method may be useful for identifying dust, grime, corrosion, tree-like structures, edges and/or slots on electrical components. The method includes capturing two optical images of an electrical component and comparing the images. Variations in pixels between the two images may be used to generate warnings.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221025&DB=EPODOC&CC=US&NR=11481892B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221025&DB=EPODOC&CC=US&NR=11481892B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Cole, Gregory A</creatorcontrib><creatorcontrib>Wang, Jianjun</creatorcontrib><creatorcontrib>Rossano, Gregory F</creatorcontrib><creatorcontrib>Kozel, Tomas</creatorcontrib><title>Method and apparatus for imaging analysis of a switchgear or the like</title><description>A method is disclosed for inspecting electrical components within a housing. 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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Method and apparatus for imaging analysis of a switchgear or the like |
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