Method and device for measuring physical objects

The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical envir...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Bullock, Ryan Steven, Smallwood, Lori Lenore, Rodriguez, Tomas Alvarez, Germer, Austin Caleb, Sparacino, Vincent Paul, Bolton, Adam James
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Bullock, Ryan Steven
Smallwood, Lori Lenore
Rodriguez, Tomas Alvarez
Germer, Austin Caleb
Sparacino, Vincent Paul
Bolton, Adam James
description The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11475582B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11475582B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11475582B13</originalsourceid><addsrcrecordid>eNrjZDDwTS3JyE9RSMxLUUhJLctMTlVIyy9SyE1NLC4tysxLVyjIqCzOTE7MUchPykpNLinmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhibmpqYWRk6GxsSoAQBVgSto</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and device for measuring physical objects</title><source>esp@cenet</source><creator>Bullock, Ryan Steven ; Smallwood, Lori Lenore ; Rodriguez, Tomas Alvarez ; Germer, Austin Caleb ; Sparacino, Vincent Paul ; Bolton, Adam James</creator><creatorcontrib>Bullock, Ryan Steven ; Smallwood, Lori Lenore ; Rodriguez, Tomas Alvarez ; Germer, Austin Caleb ; Sparacino, Vincent Paul ; Bolton, Adam James</creatorcontrib><description>The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221018&amp;DB=EPODOC&amp;CC=US&amp;NR=11475582B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221018&amp;DB=EPODOC&amp;CC=US&amp;NR=11475582B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bullock, Ryan Steven</creatorcontrib><creatorcontrib>Smallwood, Lori Lenore</creatorcontrib><creatorcontrib>Rodriguez, Tomas Alvarez</creatorcontrib><creatorcontrib>Germer, Austin Caleb</creatorcontrib><creatorcontrib>Sparacino, Vincent Paul</creatorcontrib><creatorcontrib>Bolton, Adam James</creatorcontrib><title>Method and device for measuring physical objects</title><description>The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDwTS3JyE9RSMxLUUhJLctMTlVIyy9SyE1NLC4tysxLVyjIqCzOTE7MUchPykpNLinmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhibmpqYWRk6GxsSoAQBVgSto</recordid><startdate>20221018</startdate><enddate>20221018</enddate><creator>Bullock, Ryan Steven</creator><creator>Smallwood, Lori Lenore</creator><creator>Rodriguez, Tomas Alvarez</creator><creator>Germer, Austin Caleb</creator><creator>Sparacino, Vincent Paul</creator><creator>Bolton, Adam James</creator><scope>EVB</scope></search><sort><creationdate>20221018</creationdate><title>Method and device for measuring physical objects</title><author>Bullock, Ryan Steven ; Smallwood, Lori Lenore ; Rodriguez, Tomas Alvarez ; Germer, Austin Caleb ; Sparacino, Vincent Paul ; Bolton, Adam James</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11475582B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bullock, Ryan Steven</creatorcontrib><creatorcontrib>Smallwood, Lori Lenore</creatorcontrib><creatorcontrib>Rodriguez, Tomas Alvarez</creatorcontrib><creatorcontrib>Germer, Austin Caleb</creatorcontrib><creatorcontrib>Sparacino, Vincent Paul</creatorcontrib><creatorcontrib>Bolton, Adam James</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bullock, Ryan Steven</au><au>Smallwood, Lori Lenore</au><au>Rodriguez, Tomas Alvarez</au><au>Germer, Austin Caleb</au><au>Sparacino, Vincent Paul</au><au>Bolton, Adam James</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and device for measuring physical objects</title><date>2022-10-18</date><risdate>2022</risdate><abstract>The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11475582B1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Method and device for measuring physical objects
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T21%3A14%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Bullock,%20Ryan%20Steven&rft.date=2022-10-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11475582B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true