Method and device for measuring physical objects
The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical envir...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Bullock, Ryan Steven Smallwood, Lori Lenore Rodriguez, Tomas Alvarez Germer, Austin Caleb Sparacino, Vincent Paul Bolton, Adam James |
description | The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11475582B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11475582B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11475582B13</originalsourceid><addsrcrecordid>eNrjZDDwTS3JyE9RSMxLUUhJLctMTlVIyy9SyE1NLC4tysxLVyjIqCzOTE7MUchPykpNLinmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhibmpqYWRk6GxsSoAQBVgSto</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and device for measuring physical objects</title><source>esp@cenet</source><creator>Bullock, Ryan Steven ; Smallwood, Lori Lenore ; Rodriguez, Tomas Alvarez ; Germer, Austin Caleb ; Sparacino, Vincent Paul ; Bolton, Adam James</creator><creatorcontrib>Bullock, Ryan Steven ; Smallwood, Lori Lenore ; Rodriguez, Tomas Alvarez ; Germer, Austin Caleb ; Sparacino, Vincent Paul ; Bolton, Adam James</creatorcontrib><description>The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221018&DB=EPODOC&CC=US&NR=11475582B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221018&DB=EPODOC&CC=US&NR=11475582B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bullock, Ryan Steven</creatorcontrib><creatorcontrib>Smallwood, Lori Lenore</creatorcontrib><creatorcontrib>Rodriguez, Tomas Alvarez</creatorcontrib><creatorcontrib>Germer, Austin Caleb</creatorcontrib><creatorcontrib>Sparacino, Vincent Paul</creatorcontrib><creatorcontrib>Bolton, Adam James</creatorcontrib><title>Method and device for measuring physical objects</title><description>The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDwTS3JyE9RSMxLUUhJLctMTlVIyy9SyE1NLC4tysxLVyjIqCzOTE7MUchPykpNLinmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhibmpqYWRk6GxsSoAQBVgSto</recordid><startdate>20221018</startdate><enddate>20221018</enddate><creator>Bullock, Ryan Steven</creator><creator>Smallwood, Lori Lenore</creator><creator>Rodriguez, Tomas Alvarez</creator><creator>Germer, Austin Caleb</creator><creator>Sparacino, Vincent Paul</creator><creator>Bolton, Adam James</creator><scope>EVB</scope></search><sort><creationdate>20221018</creationdate><title>Method and device for measuring physical objects</title><author>Bullock, Ryan Steven ; Smallwood, Lori Lenore ; Rodriguez, Tomas Alvarez ; Germer, Austin Caleb ; Sparacino, Vincent Paul ; Bolton, Adam James</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11475582B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bullock, Ryan Steven</creatorcontrib><creatorcontrib>Smallwood, Lori Lenore</creatorcontrib><creatorcontrib>Rodriguez, Tomas Alvarez</creatorcontrib><creatorcontrib>Germer, Austin Caleb</creatorcontrib><creatorcontrib>Sparacino, Vincent Paul</creatorcontrib><creatorcontrib>Bolton, Adam James</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bullock, Ryan Steven</au><au>Smallwood, Lori Lenore</au><au>Rodriguez, Tomas Alvarez</au><au>Germer, Austin Caleb</au><au>Sparacino, Vincent Paul</au><au>Bolton, Adam James</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and device for measuring physical objects</title><date>2022-10-18</date><risdate>2022</risdate><abstract>The method performed at an electronic device including one or more processors, a non-transitory memory, and a depth sensor includes: obtaining a task associated with a physical object within a physical environment; obtaining depth information, via the depth sensor, associated with the physical environment; determining one or more measurements for the physical object based at least in part on the depth information; obtaining a graphical overlay based at least in part on the task and the one or more measurements for the physical object; and causing presentation of the graphical overlay adjacent to a representation of the physical object, wherein the representation is obtained using sensor readings of the physical object.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US11475582B1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Method and device for measuring physical objects |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T21%3A14%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Bullock,%20Ryan%20Steven&rft.date=2022-10-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11475582B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |