Method for analyzing melting curve using bi-functional PNA probe, method for diagnosing microsatellite instability using the same, and kit for diagnosing microsatellite instability

Disclosed are a method for analyzing a melting curve using bi-functional fluorescent PNA probes, a method for diagnosing microsatellite instability (MSI) using the same, and a kit for diagnosing microsatellite instability (MSI) using the same. More particularly, disclosed are a method for analyzing...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Lee, Han Woo, Hur, Deokhwe, Lee, Si Seok, Park, Hee Kyung
Format: Patent
Sprache:eng
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