Correction method, and device for correcting image data
Various embodiments include a correction method comprising: A) reading in data of an image of a calibration pattern recorded with an optical unit, the pattern including some structures; B) simulating a line through the image, the line extending through a reference point subdividing the line into hal...
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creator | Weinlich, Andreas |
description | Various embodiments include a correction method comprising: A) reading in data of an image of a calibration pattern recorded with an optical unit, the pattern including some structures; B) simulating a line through the image, the line extending through a reference point subdividing the line into half-lines, each intersecting the imaged structures; C) determining a first and a second sequence of measured values representing distances resulting from the intersection points on the half-lines line with respect to the reference point; D) determining a third and a fourth sequence of target values representing target distances of the intersection points; E) determining a mapping specification that at least approximately maps the target values of the third and fourth sequences to the measured values of the first and second sequences, or vice versa; and F) correcting image data of an image recorded using an optical unit using the mapping specification of step E). |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11468597B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11468597B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11468597B23</originalsourceid><addsrcrecordid>eNrjZDB3zi8qSk0uyczPU8hNLcnIT9FRSMxLUUhJLctMTlVIyy9SSIaqyEtXyMxNTE9VSEksSeRhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYaGJmYWppbmTkbGxKgBAKxkLcA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Correction method, and device for correcting image data</title><source>esp@cenet</source><creator>Weinlich, Andreas</creator><creatorcontrib>Weinlich, Andreas</creatorcontrib><description>Various embodiments include a correction method comprising: A) reading in data of an image of a calibration pattern recorded with an optical unit, the pattern including some structures; B) simulating a line through the image, the line extending through a reference point subdividing the line into half-lines, each intersecting the imaged structures; C) determining a first and a second sequence of measured values representing distances resulting from the intersection points on the half-lines line with respect to the reference point; D) determining a third and a fourth sequence of target values representing target distances of the intersection points; E) determining a mapping specification that at least approximately maps the target values of the third and fourth sequences to the measured values of the first and second sequences, or vice versa; and F) correcting image data of an image recorded using an optical unit using the mapping specification of step E).</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221011&DB=EPODOC&CC=US&NR=11468597B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221011&DB=EPODOC&CC=US&NR=11468597B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Weinlich, Andreas</creatorcontrib><title>Correction method, and device for correcting image data</title><description>Various embodiments include a correction method comprising: A) reading in data of an image of a calibration pattern recorded with an optical unit, the pattern including some structures; B) simulating a line through the image, the line extending through a reference point subdividing the line into half-lines, each intersecting the imaged structures; C) determining a first and a second sequence of measured values representing distances resulting from the intersection points on the half-lines line with respect to the reference point; D) determining a third and a fourth sequence of target values representing target distances of the intersection points; E) determining a mapping specification that at least approximately maps the target values of the third and fourth sequences to the measured values of the first and second sequences, or vice versa; and F) correcting image data of an image recorded using an optical unit using the mapping specification of step E).</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB3zi8qSk0uyczPU8hNLcnIT9FRSMxLUUhJLctMTlVIyy9SSIaqyEtXyMxNTE9VSEksSeRhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYaGJmYWppbmTkbGxKgBAKxkLcA</recordid><startdate>20221011</startdate><enddate>20221011</enddate><creator>Weinlich, Andreas</creator><scope>EVB</scope></search><sort><creationdate>20221011</creationdate><title>Correction method, and device for correcting image data</title><author>Weinlich, Andreas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11468597B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Weinlich, Andreas</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Weinlich, Andreas</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Correction method, and device for correcting image data</title><date>2022-10-11</date><risdate>2022</risdate><abstract>Various embodiments include a correction method comprising: A) reading in data of an image of a calibration pattern recorded with an optical unit, the pattern including some structures; B) simulating a line through the image, the line extending through a reference point subdividing the line into half-lines, each intersecting the imaged structures; C) determining a first and a second sequence of measured values representing distances resulting from the intersection points on the half-lines line with respect to the reference point; D) determining a third and a fourth sequence of target values representing target distances of the intersection points; E) determining a mapping specification that at least approximately maps the target values of the third and fourth sequences to the measured values of the first and second sequences, or vice versa; and F) correcting image data of an image recorded using an optical unit using the mapping specification of step E).</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
title | Correction method, and device for correcting image data |
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