Automatic part testing
Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns...
Gespeichert in:
| Hauptverfasser: | , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Pratapgarhwala, Mustansir M Harwani, Anil Ahrens, Jerry A Swanstrom, Scott E Mehra, Amitabh Ley, Grant E Alverson, William R |
| description | Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11436114B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11436114B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11436114B23</originalsourceid><addsrcrecordid>eNrjZBBzLC3Jz00syUxWKEgsKlEoSS0uycxL52FgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8aHBhoYmxmZAwsnImBg1AK0JIbc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic part testing</title><source>esp@cenet</source><creator>Pratapgarhwala, Mustansir M ; Harwani, Anil ; Ahrens, Jerry A ; Swanstrom, Scott E ; Mehra, Amitabh ; Ley, Grant E ; Alverson, William R</creator><creatorcontrib>Pratapgarhwala, Mustansir M ; Harwani, Anil ; Ahrens, Jerry A ; Swanstrom, Scott E ; Mehra, Amitabh ; Ley, Grant E ; Alverson, William R</creatorcontrib><description>Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220906&DB=EPODOC&CC=US&NR=11436114B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220906&DB=EPODOC&CC=US&NR=11436114B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Pratapgarhwala, Mustansir M</creatorcontrib><creatorcontrib>Harwani, Anil</creatorcontrib><creatorcontrib>Ahrens, Jerry A</creatorcontrib><creatorcontrib>Swanstrom, Scott E</creatorcontrib><creatorcontrib>Mehra, Amitabh</creatorcontrib><creatorcontrib>Ley, Grant E</creatorcontrib><creatorcontrib>Alverson, William R</creatorcontrib><title>Automatic part testing</title><description>Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBzLC3Jz00syUxWKEgsKlEoSS0uycxL52FgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8aHBhoYmxmZAwsnImBg1AK0JIbc</recordid><startdate>20220906</startdate><enddate>20220906</enddate><creator>Pratapgarhwala, Mustansir M</creator><creator>Harwani, Anil</creator><creator>Ahrens, Jerry A</creator><creator>Swanstrom, Scott E</creator><creator>Mehra, Amitabh</creator><creator>Ley, Grant E</creator><creator>Alverson, William R</creator><scope>EVB</scope></search><sort><creationdate>20220906</creationdate><title>Automatic part testing</title><author>Pratapgarhwala, Mustansir M ; Harwani, Anil ; Ahrens, Jerry A ; Swanstrom, Scott E ; Mehra, Amitabh ; Ley, Grant E ; Alverson, William R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11436114B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Pratapgarhwala, Mustansir M</creatorcontrib><creatorcontrib>Harwani, Anil</creatorcontrib><creatorcontrib>Ahrens, Jerry A</creatorcontrib><creatorcontrib>Swanstrom, Scott E</creatorcontrib><creatorcontrib>Mehra, Amitabh</creatorcontrib><creatorcontrib>Ley, Grant E</creatorcontrib><creatorcontrib>Alverson, William R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pratapgarhwala, Mustansir M</au><au>Harwani, Anil</au><au>Ahrens, Jerry A</au><au>Swanstrom, Scott E</au><au>Mehra, Amitabh</au><au>Ley, Grant E</au><au>Alverson, William R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic part testing</title><date>2022-09-06</date><risdate>2022</risdate><abstract>Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US11436114B2 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Automatic part testing |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T15%3A39%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Pratapgarhwala,%20Mustansir%20M&rft.date=2022-09-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11436114B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |