Strain gauge having unbalanced bias for single sided applications
Disclosed herein is a strain gauge including a substrate, with a first Wheatstone bridge arrangement of resistors disposed on a first surface of the substrate, and a second Wheatstone bridge arrangement of resistors disposed remotely from the first Wheatstone bridge arrangement of resistors. The res...
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| creator | Hong, Sa Hyang On, Yun Sang Kang, Jun Hwan |
| description | Disclosed herein is a strain gauge including a substrate, with a first Wheatstone bridge arrangement of resistors disposed on a first surface of the substrate, and a second Wheatstone bridge arrangement of resistors disposed remotely from the first Wheatstone bridge arrangement of resistors. The resistors of the first Wheatstone bridge arrangement are equal in resistance to one another, while the resistors of the second Wheatstone bridge arrangement are unequal in resistance to one another and unequal to those of the first Wheatstone bridge arrangement. The first Wheatstone bridge arrangement of resistors are electrically connected in parallel with the second Wheatstone bridge arrangement of resistors such that each resistor of the first Wheatstone bridge arrangement is electrically connected in parallel with a different resistor of the second Wheatstone bridge arrangement. |
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The resistors of the first Wheatstone bridge arrangement are equal in resistance to one another, while the resistors of the second Wheatstone bridge arrangement are unequal in resistance to one another and unequal to those of the first Wheatstone bridge arrangement. The first Wheatstone bridge arrangement of resistors are electrically connected in parallel with the second Wheatstone bridge arrangement of resistors such that each resistor of the first Wheatstone bridge arrangement is electrically connected in parallel with a different resistor of the second Wheatstone bridge arrangement.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=US&NR=11415405B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=US&NR=11415405B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hong, Sa Hyang</creatorcontrib><creatorcontrib>On, Yun Sang</creatorcontrib><creatorcontrib>Kang, Jun Hwan</creatorcontrib><title>Strain gauge having unbalanced bias for single sided applications</title><description>Disclosed herein is a strain gauge including a substrate, with a first Wheatstone bridge arrangement of resistors disposed on a first surface of the substrate, and a second Wheatstone bridge arrangement of resistors disposed remotely from the first Wheatstone bridge arrangement of resistors. The resistors of the first Wheatstone bridge arrangement are equal in resistance to one another, while the resistors of the second Wheatstone bridge arrangement are unequal in resistance to one another and unequal to those of the first Wheatstone bridge arrangement. The first Wheatstone bridge arrangement of resistors are electrically connected in parallel with the second Wheatstone bridge arrangement of resistors such that each resistor of the first Wheatstone bridge arrangement is electrically connected in parallel with a different resistor of the second Wheatstone bridge arrangement.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAMLilKzMxTSE8sTU9VyEgsy8xLVyjNS0rMScxLTk1RSMpMLFZIyy9SKAZK5KQCqRSgaGJBQU5mcmJJZn5eMQ8Da1piTnEqL5TmZlB0cw1x9tBNLciPTy0uSExOzUstiQ8NNjQ0MTQ1MTB1MjImRg0A_pAxwg</recordid><startdate>20220816</startdate><enddate>20220816</enddate><creator>Hong, Sa Hyang</creator><creator>On, Yun Sang</creator><creator>Kang, Jun Hwan</creator><scope>EVB</scope></search><sort><creationdate>20220816</creationdate><title>Strain gauge having unbalanced bias for single sided applications</title><author>Hong, Sa Hyang ; On, Yun Sang ; Kang, Jun Hwan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11415405B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Hong, Sa Hyang</creatorcontrib><creatorcontrib>On, Yun Sang</creatorcontrib><creatorcontrib>Kang, Jun Hwan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hong, Sa Hyang</au><au>On, Yun Sang</au><au>Kang, Jun Hwan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Strain gauge having unbalanced bias for single sided applications</title><date>2022-08-16</date><risdate>2022</risdate><abstract>Disclosed herein is a strain gauge including a substrate, with a first Wheatstone bridge arrangement of resistors disposed on a first surface of the substrate, and a second Wheatstone bridge arrangement of resistors disposed remotely from the first Wheatstone bridge arrangement of resistors. The resistors of the first Wheatstone bridge arrangement are equal in resistance to one another, while the resistors of the second Wheatstone bridge arrangement are unequal in resistance to one another and unequal to those of the first Wheatstone bridge arrangement. The first Wheatstone bridge arrangement of resistors are electrically connected in parallel with the second Wheatstone bridge arrangement of resistors such that each resistor of the first Wheatstone bridge arrangement is electrically connected in parallel with a different resistor of the second Wheatstone bridge arrangement.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Strain gauge having unbalanced bias for single sided applications |
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