Automatic analyzer and sample-processing system

Automatic analyzer and sample-processing system

A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preproce...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Shibuya, Takeshi, Akutsu, Masashi, Tokieda, Hitoshi, Takagi, Yoshimitsu
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Shibuya, Takeshi
Akutsu, Masashi
Tokieda, Hitoshi
Takagi, Yoshimitsu
description A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11391750B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11391750B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11391750B23</originalsourceid><addsrcrecordid>eNrjZNB3LC3Jz00syUxWSMxLzKmsSi0CMlIUihNzC3JSdQuK8pNTi4sz89IViiuLS1JzeRhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJfGiwoaGxpaG5qYGTkTExagBlxCuR</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic analyzer and sample-processing system</title><source>esp@cenet</source><creator>Shibuya, Takeshi ; Akutsu, Masashi ; Tokieda, Hitoshi ; Takagi, Yoshimitsu</creator><creatorcontrib>Shibuya, Takeshi ; Akutsu, Masashi ; Tokieda, Hitoshi ; Takagi, Yoshimitsu</creatorcontrib><description>A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220719&amp;DB=EPODOC&amp;CC=US&amp;NR=11391750B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220719&amp;DB=EPODOC&amp;CC=US&amp;NR=11391750B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Shibuya, Takeshi</creatorcontrib><creatorcontrib>Akutsu, Masashi</creatorcontrib><creatorcontrib>Tokieda, Hitoshi</creatorcontrib><creatorcontrib>Takagi, Yoshimitsu</creatorcontrib><title>Automatic analyzer and sample-processing system</title><description>A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB3LC3Jz00syUxWSMxLzKmsSi0CMlIUihNzC3JSdQuK8pNTi4sz89IViiuLS1JzeRhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJfGiwoaGxpaG5qYGTkTExagBlxCuR</recordid><startdate>20220719</startdate><enddate>20220719</enddate><creator>Shibuya, Takeshi</creator><creator>Akutsu, Masashi</creator><creator>Tokieda, Hitoshi</creator><creator>Takagi, Yoshimitsu</creator><scope>EVB</scope></search><sort><creationdate>20220719</creationdate><title>Automatic analyzer and sample-processing system</title><author>Shibuya, Takeshi ; Akutsu, Masashi ; Tokieda, Hitoshi ; Takagi, Yoshimitsu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11391750B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Shibuya, Takeshi</creatorcontrib><creatorcontrib>Akutsu, Masashi</creatorcontrib><creatorcontrib>Tokieda, Hitoshi</creatorcontrib><creatorcontrib>Takagi, Yoshimitsu</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shibuya, Takeshi</au><au>Akutsu, Masashi</au><au>Tokieda, Hitoshi</au><au>Takagi, Yoshimitsu</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic analyzer and sample-processing system</title><date>2022-07-19</date><risdate>2022</risdate><abstract>A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11391750B2
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Automatic analyzer and sample-processing system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-15T05%3A34%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Shibuya,%20Takeshi&rft.date=2022-07-19&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11391750B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true