Device manufacturing method and computer program

A device manufacturing method using a lithographic apparatus having a localized immersion system for confining an immersion liquid to a space between a projection system and a substrate to be exposed by the projection system, the method including: predicting a set of first locations on the substrate...

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Hauptverfasser: Hoefnagels, Pieter Jeroen Johan Emanuel, Kox, Ronald Frank, Van Oene, Maarten Marinus, Vieyra Salas, Jorge Alberto, Gattobigio, Giovanni Luca, Van Der Zanden, Marcus Johannes
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creator Hoefnagels, Pieter Jeroen Johan Emanuel
Kox, Ronald Frank
Van Oene, Maarten Marinus
Vieyra Salas, Jorge Alberto
Gattobigio, Giovanni Luca
Van Der Zanden, Marcus Johannes
description A device manufacturing method using a lithographic apparatus having a localized immersion system for confining an immersion liquid to a space between a projection system and a substrate to be exposed by the projection system, the method including: predicting a set of first locations on the substrate having a risk of residual liquid from the immersion system when exposed using an initial route for a substrate to expose a plurality of fields thereon; determining a set of modifications to the initial route to reduce the risk of residual loss; test exposing at least one test substrate using the initial route; obtaining a set of second locations of defects in the exposed test substrate; selecting a subset of the set of modifications by comparing the first locations and the second locations; and exposing a plurality of production substrates using the initial route modified by the selected subset of modifications.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11372339B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11372339B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11372339B13</originalsourceid><addsrcrecordid>eNrjZDBwSS3LTE5VyE3MK01LTC4pLcrMS1fITS3JyE9RSMxLUUjOzy0oLUktUigoyk8vSszlYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhsbmRsbGlk6GxsSoAQCExyvC</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Device manufacturing method and computer program</title><source>esp@cenet</source><creator>Hoefnagels, Pieter Jeroen Johan Emanuel ; Kox, Ronald Frank ; Van Oene, Maarten Marinus ; Vieyra Salas, Jorge Alberto ; Gattobigio, Giovanni Luca ; Van Der Zanden, Marcus Johannes</creator><creatorcontrib>Hoefnagels, Pieter Jeroen Johan Emanuel ; Kox, Ronald Frank ; Van Oene, Maarten Marinus ; Vieyra Salas, Jorge Alberto ; Gattobigio, Giovanni Luca ; Van Der Zanden, Marcus Johannes</creatorcontrib><description>A device manufacturing method using a lithographic apparatus having a localized immersion system for confining an immersion liquid to a space between a projection system and a substrate to be exposed by the projection system, the method including: predicting a set of first locations on the substrate having a risk of residual liquid from the immersion system when exposed using an initial route for a substrate to expose a plurality of fields thereon; determining a set of modifications to the initial route to reduce the risk of residual loss; test exposing at least one test substrate using the initial route; obtaining a set of second locations of defects in the exposed test substrate; selecting a subset of the set of modifications by comparing the first locations and the second locations; and exposing a plurality of production substrates using the initial route modified by the selected subset of modifications.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220628&amp;DB=EPODOC&amp;CC=US&amp;NR=11372339B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220628&amp;DB=EPODOC&amp;CC=US&amp;NR=11372339B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hoefnagels, Pieter Jeroen Johan Emanuel</creatorcontrib><creatorcontrib>Kox, Ronald Frank</creatorcontrib><creatorcontrib>Van Oene, Maarten Marinus</creatorcontrib><creatorcontrib>Vieyra Salas, Jorge Alberto</creatorcontrib><creatorcontrib>Gattobigio, Giovanni Luca</creatorcontrib><creatorcontrib>Van Der Zanden, Marcus Johannes</creatorcontrib><title>Device manufacturing method and computer program</title><description>A device manufacturing method using a lithographic apparatus having a localized immersion system for confining an immersion liquid to a space between a projection system and a substrate to be exposed by the projection system, the method including: predicting a set of first locations on the substrate having a risk of residual liquid from the immersion system when exposed using an initial route for a substrate to expose a plurality of fields thereon; determining a set of modifications to the initial route to reduce the risk of residual loss; test exposing at least one test substrate using the initial route; obtaining a set of second locations of defects in the exposed test substrate; selecting a subset of the set of modifications by comparing the first locations and the second locations; and exposing a plurality of production substrates using the initial route modified by the selected subset of modifications.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBwSS3LTE5VyE3MK01LTC4pLcrMS1fITS3JyE9RSMxLUUjOzy0oLUktUigoyk8vSszlYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhsbmRsbGlk6GxsSoAQCExyvC</recordid><startdate>20220628</startdate><enddate>20220628</enddate><creator>Hoefnagels, Pieter Jeroen Johan Emanuel</creator><creator>Kox, Ronald Frank</creator><creator>Van Oene, Maarten Marinus</creator><creator>Vieyra Salas, Jorge Alberto</creator><creator>Gattobigio, Giovanni Luca</creator><creator>Van Der Zanden, Marcus Johannes</creator><scope>EVB</scope></search><sort><creationdate>20220628</creationdate><title>Device manufacturing method and computer program</title><author>Hoefnagels, Pieter Jeroen Johan Emanuel ; Kox, Ronald Frank ; Van Oene, Maarten Marinus ; Vieyra Salas, Jorge Alberto ; Gattobigio, Giovanni Luca ; Van Der Zanden, Marcus Johannes</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11372339B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Hoefnagels, Pieter Jeroen Johan Emanuel</creatorcontrib><creatorcontrib>Kox, Ronald Frank</creatorcontrib><creatorcontrib>Van Oene, Maarten Marinus</creatorcontrib><creatorcontrib>Vieyra Salas, Jorge Alberto</creatorcontrib><creatorcontrib>Gattobigio, Giovanni Luca</creatorcontrib><creatorcontrib>Van Der Zanden, Marcus Johannes</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hoefnagels, Pieter Jeroen Johan Emanuel</au><au>Kox, Ronald Frank</au><au>Van Oene, Maarten Marinus</au><au>Vieyra Salas, Jorge Alberto</au><au>Gattobigio, Giovanni Luca</au><au>Van Der Zanden, Marcus Johannes</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device manufacturing method and computer program</title><date>2022-06-28</date><risdate>2022</risdate><abstract>A device manufacturing method using a lithographic apparatus having a localized immersion system for confining an immersion liquid to a space between a projection system and a substrate to be exposed by the projection system, the method including: predicting a set of first locations on the substrate having a risk of residual liquid from the immersion system when exposed using an initial route for a substrate to expose a plurality of fields thereon; determining a set of modifications to the initial route to reduce the risk of residual loss; test exposing at least one test substrate using the initial route; obtaining a set of second locations of defects in the exposed test substrate; selecting a subset of the set of modifications by comparing the first locations and the second locations; and exposing a plurality of production substrates using the initial route modified by the selected subset of modifications.</abstract><oa>free_for_read</oa></addata></record>
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subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title Device manufacturing method and computer program
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T03%3A15%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Hoefnagels,%20Pieter%20Jeroen%20Johan%20Emanuel&rft.date=2022-06-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11372339B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true