Methods and apparatus for optically detecting magnetic resonance

A magnetometer containing a crystal sensor with solid-state defects senses the magnitude and direction of a magnetic field. The solid-state defects in the crystal sensor absorb microwave and optical energy to transition between several energy states while emitting light intensity indicative of their...

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Hauptverfasser: Pham, Linh M, Johnson, Kerry Alexander, Clevenson, Hannah A, Braje, Danielle Ann, Barry, John Francis, McNally, Christopher Michael, Teale, Carson Arthur
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creator Pham, Linh M
Johnson, Kerry Alexander
Clevenson, Hannah A
Braje, Danielle Ann
Barry, John Francis
McNally, Christopher Michael
Teale, Carson Arthur
description A magnetometer containing a crystal sensor with solid-state defects senses the magnitude and direction of a magnetic field. The solid-state defects in the crystal sensor absorb microwave and optical energy to transition between several energy states while emitting light intensity indicative of their spin states. The magnetic field alters the spin-state transitions of the solid-state defects by amounts depending on the solid-state defects' orientations with respect to the magnetic field. The optical read out, reporting the spin state of an ensemble of solid-state defects from one particular orientation class, can be used to lock microwave signals to the resonances associated with the spin-state transitions. The frequencies of the locked microwave signals can be used to reconstruct the magnetic field vector.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11346904B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11346904B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11346904B23</originalsourceid><addsrcrecordid>eNrjZHDwTS3JyE8pVkjMS1FILChILEosKS1WSMsvUsgvKMlMTszJqVRISS1JTS7JzEtXyE1Mz0sFCisUpRbn5yXmJafyMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5FSgjvjQYENDYxMzSwMTJyNjYtQAAPvCMeA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and apparatus for optically detecting magnetic resonance</title><source>esp@cenet</source><creator>Pham, Linh M ; Johnson, Kerry Alexander ; Clevenson, Hannah A ; Braje, Danielle Ann ; Barry, John Francis ; McNally, Christopher Michael ; Teale, Carson Arthur</creator><creatorcontrib>Pham, Linh M ; Johnson, Kerry Alexander ; Clevenson, Hannah A ; Braje, Danielle Ann ; Barry, John Francis ; McNally, Christopher Michael ; Teale, Carson Arthur</creatorcontrib><description>A magnetometer containing a crystal sensor with solid-state defects senses the magnitude and direction of a magnetic field. The solid-state defects in the crystal sensor absorb microwave and optical energy to transition between several energy states while emitting light intensity indicative of their spin states. The magnetic field alters the spin-state transitions of the solid-state defects by amounts depending on the solid-state defects' orientations with respect to the magnetic field. The optical read out, reporting the spin state of an ensemble of solid-state defects from one particular orientation class, can be used to lock microwave signals to the resonances associated with the spin-state transitions. The frequencies of the locked microwave signals can be used to reconstruct the magnetic field vector.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220531&amp;DB=EPODOC&amp;CC=US&amp;NR=11346904B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220531&amp;DB=EPODOC&amp;CC=US&amp;NR=11346904B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Pham, Linh M</creatorcontrib><creatorcontrib>Johnson, Kerry Alexander</creatorcontrib><creatorcontrib>Clevenson, Hannah A</creatorcontrib><creatorcontrib>Braje, Danielle Ann</creatorcontrib><creatorcontrib>Barry, John Francis</creatorcontrib><creatorcontrib>McNally, Christopher Michael</creatorcontrib><creatorcontrib>Teale, Carson Arthur</creatorcontrib><title>Methods and apparatus for optically detecting magnetic resonance</title><description>A magnetometer containing a crystal sensor with solid-state defects senses the magnitude and direction of a magnetic field. The solid-state defects in the crystal sensor absorb microwave and optical energy to transition between several energy states while emitting light intensity indicative of their spin states. The magnetic field alters the spin-state transitions of the solid-state defects by amounts depending on the solid-state defects' orientations with respect to the magnetic field. The optical read out, reporting the spin state of an ensemble of solid-state defects from one particular orientation class, can be used to lock microwave signals to the resonances associated with the spin-state transitions. The frequencies of the locked microwave signals can be used to reconstruct the magnetic field vector.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDwTS3JyE8pVkjMS1FILChILEosKS1WSMsvUsgvKMlMTszJqVRISS1JTS7JzEtXyE1Mz0sFCisUpRbn5yXmJafyMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5FSgjvjQYENDYxMzSwMTJyNjYtQAAPvCMeA</recordid><startdate>20220531</startdate><enddate>20220531</enddate><creator>Pham, Linh M</creator><creator>Johnson, Kerry Alexander</creator><creator>Clevenson, Hannah A</creator><creator>Braje, Danielle Ann</creator><creator>Barry, John Francis</creator><creator>McNally, Christopher Michael</creator><creator>Teale, Carson Arthur</creator><scope>EVB</scope></search><sort><creationdate>20220531</creationdate><title>Methods and apparatus for optically detecting magnetic resonance</title><author>Pham, Linh M ; Johnson, Kerry Alexander ; Clevenson, Hannah A ; Braje, Danielle Ann ; Barry, John Francis ; McNally, Christopher Michael ; Teale, Carson Arthur</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11346904B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Pham, Linh M</creatorcontrib><creatorcontrib>Johnson, Kerry Alexander</creatorcontrib><creatorcontrib>Clevenson, Hannah A</creatorcontrib><creatorcontrib>Braje, Danielle Ann</creatorcontrib><creatorcontrib>Barry, John Francis</creatorcontrib><creatorcontrib>McNally, Christopher Michael</creatorcontrib><creatorcontrib>Teale, Carson Arthur</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pham, Linh M</au><au>Johnson, Kerry Alexander</au><au>Clevenson, Hannah A</au><au>Braje, Danielle Ann</au><au>Barry, John Francis</au><au>McNally, Christopher Michael</au><au>Teale, Carson Arthur</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and apparatus for optically detecting magnetic resonance</title><date>2022-05-31</date><risdate>2022</risdate><abstract>A magnetometer containing a crystal sensor with solid-state defects senses the magnitude and direction of a magnetic field. The solid-state defects in the crystal sensor absorb microwave and optical energy to transition between several energy states while emitting light intensity indicative of their spin states. The magnetic field alters the spin-state transitions of the solid-state defects by amounts depending on the solid-state defects' orientations with respect to the magnetic field. The optical read out, reporting the spin state of an ensemble of solid-state defects from one particular orientation class, can be used to lock microwave signals to the resonances associated with the spin-state transitions. The frequencies of the locked microwave signals can be used to reconstruct the magnetic field vector.</abstract><oa>free_for_read</oa></addata></record>
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source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Methods and apparatus for optically detecting magnetic resonance
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T10%3A00%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Pham,%20Linh%20M&rft.date=2022-05-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11346904B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true