Intelligent memory device test rack

A test rack includes two or more memory device test boards where each memory device test boards includes two or more memory device test resources. Each of the two or more memory device test boards includes a separate processing device allocated to the memory device test resources of a corresponding...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Shepard, Donald, Hamor, Gary D, Spica, Michael R, Caraher, Patrick, Elmiro da Rocha Chaves, João
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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