Scan synchronous-write-through testing architectures for a memory device

An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation incl...

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Bibliographische Detailangaben

Hauptverfasser:	Katoch, Atul, Tsai, Ming-Chien, Huang, Chia-En, Adham, Saman M. I, Yang, Hao-I, Lin, Kao-Cheng, Chandra, Uppu Sharath, Mikan, Jr., Donald G, Chang, Ming-Hung, Chang, Tsung-Yung, Wu, Ching-Wei
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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