Method and apparatus for coating thickness inspection of a surface and coating defects of the surface

Method and apparatus for coating thickness inspection of a surface and coating defects of the surface

A method and apparatus is provided to inspect coverage of a coating applied to a surface of a component. A coating color space value of a color of the coating is obtained based on a camera, a light source, and the surface, each value having an associated coating thickness applied to the surface. Ima...

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Hauptverfasser: McHenry, Jacob Pete, Kelsey, William David, Pham, Rosemary, Afrasiabi, Amir, Burnett, Gabriel, Chockalingam, Chandler
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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creator McHenry, Jacob Pete
Kelsey, William David
Pham, Rosemary
Afrasiabi, Amir
Burnett, Gabriel
Chockalingam, Chandler
description A method and apparatus is provided to inspect coverage of a coating applied to a surface of a component. A coating color space value of a color of the coating is obtained based on a camera, a light source, and the surface, each value having an associated coating thickness applied to the surface. Images of the coating covered surface are obtained. Each image is processed by determining color space values of the image, determining whether the associated coating thickness of the color space values is within a specified tolerance of a required thickness of coating based on a comparison of the color space values to color space values associated with the required thickness of coating, and responsive to the associated thickness of coating of the color space values being outside of the specified tolerance, providing an indication that the surface shown in the image is outside of the specified tolerance.
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subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title Method and apparatus for coating thickness inspection of a surface and coating defects of the surface
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