Method for predicting deterioration of grease, grease, and method for manufacturing grease

In a method for predicting deterioration of grease, the grease is applied between a semiconductor module and a cooler. The semiconductor module accommodates a semiconductor element. The method for predicting deterioration includes predicting deterioration of the grease after specified heat cycles by...

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Hauptverfasser: Uchiyama, Kazunori, Hakamada, Naoki, Yoshida, Tadafumi, Sasaki, Tomo
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creator Uchiyama, Kazunori
Hakamada, Naoki
Yoshida, Tadafumi
Sasaki, Tomo
description In a method for predicting deterioration of grease, the grease is applied between a semiconductor module and a cooler. The semiconductor module accommodates a semiconductor element. The method for predicting deterioration includes predicting deterioration of the grease after specified heat cycles by using: a variable G1/G2 that is acquired by dividing an initial storage modulus G1 of the grease by an initial loss modulus G2 of the grease at an expected maximum use temperature of the semiconductor element; and distortion dD of the grease at the time when the initial storage modulus G1 and the initial loss modulus G2 have the same value.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11215604B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11215604B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11215604B23</originalsourceid><addsrcrecordid>eNrjZIjyTS3JyE9RSMsvUigoSk3JTC7JzEtXSEktSS3KzC9KLMnMz1PIT1NIL0pNLE7VgdOJeSkKuQituYl5pWmJySWlRSDdEEU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSQ-NNjQ0MjQ1MzAxMnImBg1ABnWOwg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for predicting deterioration of grease, grease, and method for manufacturing grease</title><source>esp@cenet</source><creator>Uchiyama, Kazunori ; Hakamada, Naoki ; Yoshida, Tadafumi ; Sasaki, Tomo</creator><creatorcontrib>Uchiyama, Kazunori ; Hakamada, Naoki ; Yoshida, Tadafumi ; Sasaki, Tomo</creatorcontrib><description>In a method for predicting deterioration of grease, the grease is applied between a semiconductor module and a cooler. The semiconductor module accommodates a semiconductor element. The method for predicting deterioration includes predicting deterioration of the grease after specified heat cycles by using: a variable G1/G2 that is acquired by dividing an initial storage modulus G1 of the grease by an initial loss modulus G2 of the grease at an expected maximum use temperature of the semiconductor element; and distortion dD of the grease at the time when the initial storage modulus G1 and the initial loss modulus G2 have the same value.</description><language>eng</language><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G ; CHEMISTRY ; COMPOSITIONS BASED THEREON ; GENERAL PROCESSES OF COMPOUNDING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; METALLURGY ; ORGANIC MACROMOLECULAR COMPOUNDS ; PHYSICS ; TESTING ; THEIR PREPARATION OR CHEMICAL WORKING-UP ; WORKING-UP</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220104&amp;DB=EPODOC&amp;CC=US&amp;NR=11215604B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220104&amp;DB=EPODOC&amp;CC=US&amp;NR=11215604B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Uchiyama, Kazunori</creatorcontrib><creatorcontrib>Hakamada, Naoki</creatorcontrib><creatorcontrib>Yoshida, Tadafumi</creatorcontrib><creatorcontrib>Sasaki, Tomo</creatorcontrib><title>Method for predicting deterioration of grease, grease, and method for manufacturing grease</title><description>In a method for predicting deterioration of grease, the grease is applied between a semiconductor module and a cooler. The semiconductor module accommodates a semiconductor element. The method for predicting deterioration includes predicting deterioration of the grease after specified heat cycles by using: a variable G1/G2 that is acquired by dividing an initial storage modulus G1 of the grease by an initial loss modulus G2 of the grease at an expected maximum use temperature of the semiconductor element; and distortion dD of the grease at the time when the initial storage modulus G1 and the initial loss modulus G2 have the same value.</description><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G</subject><subject>CHEMISTRY</subject><subject>COMPOSITIONS BASED THEREON</subject><subject>GENERAL PROCESSES OF COMPOUNDING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>ORGANIC MACROMOLECULAR COMPOUNDS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>THEIR PREPARATION OR CHEMICAL WORKING-UP</subject><subject>WORKING-UP</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjyTS3JyE9RSMsvUigoSk3JTC7JzEtXSEktSS3KzC9KLMnMz1PIT1NIL0pNLE7VgdOJeSkKuQituYl5pWmJySWlRSDdEEU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSQ-NNjQ0MjQ1MzAxMnImBg1ABnWOwg</recordid><startdate>20220104</startdate><enddate>20220104</enddate><creator>Uchiyama, Kazunori</creator><creator>Hakamada, Naoki</creator><creator>Yoshida, Tadafumi</creator><creator>Sasaki, Tomo</creator><scope>EVB</scope></search><sort><creationdate>20220104</creationdate><title>Method for predicting deterioration of grease, grease, and method for manufacturing grease</title><author>Uchiyama, Kazunori ; Hakamada, Naoki ; Yoshida, Tadafumi ; Sasaki, Tomo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11215604B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G</topic><topic>CHEMISTRY</topic><topic>COMPOSITIONS BASED THEREON</topic><topic>GENERAL PROCESSES OF COMPOUNDING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>METALLURGY</topic><topic>ORGANIC MACROMOLECULAR COMPOUNDS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>THEIR PREPARATION OR CHEMICAL WORKING-UP</topic><topic>WORKING-UP</topic><toplevel>online_resources</toplevel><creatorcontrib>Uchiyama, Kazunori</creatorcontrib><creatorcontrib>Hakamada, Naoki</creatorcontrib><creatorcontrib>Yoshida, Tadafumi</creatorcontrib><creatorcontrib>Sasaki, Tomo</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Uchiyama, Kazunori</au><au>Hakamada, Naoki</au><au>Yoshida, Tadafumi</au><au>Sasaki, Tomo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for predicting deterioration of grease, grease, and method for manufacturing grease</title><date>2022-01-04</date><risdate>2022</risdate><abstract>In a method for predicting deterioration of grease, the grease is applied between a semiconductor module and a cooler. The semiconductor module accommodates a semiconductor element. The method for predicting deterioration includes predicting deterioration of the grease after specified heat cycles by using: a variable G1/G2 that is acquired by dividing an initial storage modulus G1 of the grease by an initial loss modulus G2 of the grease at an expected maximum use temperature of the semiconductor element; and distortion dD of the grease at the time when the initial storage modulus G1 and the initial loss modulus G2 have the same value.</abstract><oa>free_for_read</oa></addata></record>
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subjects AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G
CHEMISTRY
COMPOSITIONS BASED THEREON
GENERAL PROCESSES OF COMPOUNDING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
METALLURGY
ORGANIC MACROMOLECULAR COMPOUNDS
PHYSICS
TESTING
THEIR PREPARATION OR CHEMICAL WORKING-UP
WORKING-UP
title Method for predicting deterioration of grease, grease, and method for manufacturing grease
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T05%3A34%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Uchiyama,%20Kazunori&rft.date=2022-01-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11215604B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true