Information processing apparatus, information processing method, and storage medium for defect inspection and detection
The present invention is directed to making it possible to reduce a possibility of image stitching failures. An information processing apparatus includes a feature extraction unit configured to extract feature points from each of a plurality of images of an object to be inspected captured from a plu...
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creator | Kuwabara, Nobuaki Mamiya, Satoru |
description | The present invention is directed to making it possible to reduce a possibility of image stitching failures. An information processing apparatus includes a feature extraction unit configured to extract feature points from each of a plurality of images of an object to be inspected captured from a plurality of viewpoints, an image quality evaluation unit configured to, for each of the plurality of images, evaluate whether an image quality based on a predetermined index satisfies allowable conditions for inspection works of the object, and an image stitching unit configured to stitch at least a part of the images, among the plurality of images, having the image quality that satisfies the allowable conditions according to a positional relation based on the feature points. |
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An information processing apparatus includes a feature extraction unit configured to extract feature points from each of a plurality of images of an object to be inspected captured from a plurality of viewpoints, an image quality evaluation unit configured to, for each of the plurality of images, evaluate whether an image quality based on a predetermined index satisfies allowable conditions for inspection works of the object, and an image stitching unit configured to stitch at least a part of the images, among the plurality of images, having the image quality that satisfies the allowable conditions according to a positional relation based on the feature points.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211228&DB=EPODOC&CC=US&NR=11210773B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211228&DB=EPODOC&CC=US&NR=11210773B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kuwabara, Nobuaki</creatorcontrib><creatorcontrib>Mamiya, Satoru</creatorcontrib><title>Information processing apparatus, information processing method, and storage medium for defect inspection and detection</title><description>The present invention is directed to making it possible to reduce a possibility of image stitching failures. An information processing apparatus includes a feature extraction unit configured to extract feature points from each of a plurality of images of an object to be inspected captured from a plurality of viewpoints, an image quality evaluation unit configured to, for each of the plurality of images, evaluate whether an image quality based on a predetermined index satisfies allowable conditions for inspection works of the object, and an image stitching unit configured to stitch at least a part of the images, among the plurality of images, having the image quality that satisfies the allowable conditions according to a positional relation based on the feature points.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7sKwkAQRbexEPUfxj6CSYr0iqK1WodhdzZZcB_sTPD33aClhdXhXs5Zqtc12Jg9iosBUo6amF0YAFPCjDJxBe634UnGaCrAYIAlZhyofMZNHooPhixpKTGnwrmdRUPyWWu1sPhk2ny5Utvz6X687CjFnjihpkDSP2513dT7rmsPTfuP8wYTWUb3</recordid><startdate>20211228</startdate><enddate>20211228</enddate><creator>Kuwabara, Nobuaki</creator><creator>Mamiya, Satoru</creator><scope>EVB</scope></search><sort><creationdate>20211228</creationdate><title>Information processing apparatus, information processing method, and storage medium for defect inspection and detection</title><author>Kuwabara, Nobuaki ; Mamiya, Satoru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11210773B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Kuwabara, Nobuaki</creatorcontrib><creatorcontrib>Mamiya, Satoru</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kuwabara, Nobuaki</au><au>Mamiya, Satoru</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Information processing apparatus, information processing method, and storage medium for defect inspection and detection</title><date>2021-12-28</date><risdate>2021</risdate><abstract>The present invention is directed to making it possible to reduce a possibility of image stitching failures. An information processing apparatus includes a feature extraction unit configured to extract feature points from each of a plurality of images of an object to be inspected captured from a plurality of viewpoints, an image quality evaluation unit configured to, for each of the plurality of images, evaluate whether an image quality based on a predetermined index satisfies allowable conditions for inspection works of the object, and an image stitching unit configured to stitch at least a part of the images, among the plurality of images, having the image quality that satisfies the allowable conditions according to a positional relation based on the feature points.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
title | Information processing apparatus, information processing method, and storage medium for defect inspection and detection |
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