Method for manufacturing light emitting device
A method for manufacturing a light emitting device includes: providing an intermediate structure including first and second layered structures arranged in a first direction in a light reflecting member, wherein each of the layered structures includes a first and second electrodes arranged in a secon...
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| creator | Ikeda, Tadaaki Hashimoto, Toru |
| description | A method for manufacturing a light emitting device includes: providing an intermediate structure including first and second layered structures arranged in a first direction in a light reflecting member, wherein each of the layered structures includes a first and second electrodes arranged in a second direction, and wherein the intermediate structure has a first surface at which the first and second electrodes are exposed; on the first surface, forming a first hole in the light reflecting member between the first electrodes as viewed in the second direction; on the first surface, forming a second hole in the light reflecting member between the second electrodes as viewed in the second direction; forming a conductive film on exposed surfaces of the first and second electrodes, and in the first and second holes; and severing the light reflecting member and the conductive film at positions that pass through the first and second holes. |
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on the first surface, forming a first hole in the light reflecting member between the first electrodes as viewed in the second direction; on the first surface, forming a second hole in the light reflecting member between the second electrodes as viewed in the second direction; forming a conductive film on exposed surfaces of the first and second electrodes, and in the first and second holes; and severing the light reflecting member and the conductive film at positions that pass through the first and second holes.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211214&DB=EPODOC&CC=US&NR=11201258B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211214&DB=EPODOC&CC=US&NR=11201258B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Ikeda, Tadaaki</creatorcontrib><creatorcontrib>Hashimoto, Toru</creatorcontrib><title>Method for manufacturing light emitting device</title><description>A method for manufacturing a light emitting device includes: providing an intermediate structure including first and second layered structures arranged in a first direction in a light reflecting member, wherein each of the layered structures includes a first and second electrodes arranged in a second direction, and wherein the intermediate structure has a first surface at which the first and second electrodes are exposed; on the first surface, forming a first hole in the light reflecting member between the first electrodes as viewed in the second direction; on the first surface, forming a second hole in the light reflecting member between the second electrodes as viewed in the second direction; forming a conductive film on exposed surfaces of the first and second electrodes, and in the first and second holes; and severing the light reflecting member and the conductive film at positions that pass through the first and second holes.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDzTS3JyE9RSMsvUshNzCtNS0wuKS3KzEtXyMlMzyhRSM3NLCkBcVNSyzKTU3kYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSXxosKGhkYGhkamFk5ExMWoAEXwq1g</recordid><startdate>20211214</startdate><enddate>20211214</enddate><creator>Ikeda, Tadaaki</creator><creator>Hashimoto, Toru</creator><scope>EVB</scope></search><sort><creationdate>20211214</creationdate><title>Method for manufacturing light emitting device</title><author>Ikeda, Tadaaki ; 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on the first surface, forming a first hole in the light reflecting member between the first electrodes as viewed in the second direction; on the first surface, forming a second hole in the light reflecting member between the second electrodes as viewed in the second direction; forming a conductive film on exposed surfaces of the first and second electrodes, and in the first and second holes; and severing the light reflecting member and the conductive film at positions that pass through the first and second holes.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | Method for manufacturing light emitting device |
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