Verification of software test quality using hidden variables

A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises dete...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Hicks, Andrew C. M, Blue, Dale E, Minerley, Kevin, Rawlins, Ryan Thomas, Gisolfi, Daniel Nicolas
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Hicks, Andrew C. M
Blue, Dale E
Minerley, Kevin
Rawlins, Ryan Thomas
Gisolfi, Daniel Nicolas
description A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises determining a current success rate value (SRV) for the current test that represents a success rate of the current test for the first version of the SUT. The method further comprises combining the current SRV of the first version of the SUT and current SRVs of the current test for prior versions of the SUT into a current test eigenvector associated with the current test. The method further comprises converting the current test eigenvector into a first eigenvalue that represents a health, accuracy, and quality of the first version of the SUT.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11188453B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11188453B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11188453B13</originalsourceid><addsrcrecordid>eNrjZLAJSy3KTMtMTizJzM9TyE9TKM5PKylPLEpVKEktLlEoLE3MySypVCgtzsxLV8jITElJzVMoSyzKTEzKSS3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhoYWFiamxk6GxsSoAQAicjBq</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Verification of software test quality using hidden variables</title><source>esp@cenet</source><creator>Hicks, Andrew C. M ; Blue, Dale E ; Minerley, Kevin ; Rawlins, Ryan Thomas ; Gisolfi, Daniel Nicolas</creator><creatorcontrib>Hicks, Andrew C. M ; Blue, Dale E ; Minerley, Kevin ; Rawlins, Ryan Thomas ; Gisolfi, Daniel Nicolas</creatorcontrib><description>A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises determining a current success rate value (SRV) for the current test that represents a success rate of the current test for the first version of the SUT. The method further comprises combining the current SRV of the first version of the SUT and current SRVs of the current test for prior versions of the SUT into a current test eigenvector associated with the current test. The method further comprises converting the current test eigenvector into a first eigenvalue that represents a health, accuracy, and quality of the first version of the SUT.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211130&amp;DB=EPODOC&amp;CC=US&amp;NR=11188453B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211130&amp;DB=EPODOC&amp;CC=US&amp;NR=11188453B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hicks, Andrew C. M</creatorcontrib><creatorcontrib>Blue, Dale E</creatorcontrib><creatorcontrib>Minerley, Kevin</creatorcontrib><creatorcontrib>Rawlins, Ryan Thomas</creatorcontrib><creatorcontrib>Gisolfi, Daniel Nicolas</creatorcontrib><title>Verification of software test quality using hidden variables</title><description>A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises determining a current success rate value (SRV) for the current test that represents a success rate of the current test for the first version of the SUT. The method further comprises combining the current SRV of the first version of the SUT and current SRVs of the current test for prior versions of the SUT into a current test eigenvector associated with the current test. The method further comprises converting the current test eigenvector into a first eigenvalue that represents a health, accuracy, and quality of the first version of the SUT.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAJSy3KTMtMTizJzM9TyE9TKM5PKylPLEpVKEktLlEoLE3MySypVCgtzsxLV8jITElJzVMoSyzKTEzKSS3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhoYWFiamxk6GxsSoAQAicjBq</recordid><startdate>20211130</startdate><enddate>20211130</enddate><creator>Hicks, Andrew C. M</creator><creator>Blue, Dale E</creator><creator>Minerley, Kevin</creator><creator>Rawlins, Ryan Thomas</creator><creator>Gisolfi, Daniel Nicolas</creator><scope>EVB</scope></search><sort><creationdate>20211130</creationdate><title>Verification of software test quality using hidden variables</title><author>Hicks, Andrew C. M ; Blue, Dale E ; Minerley, Kevin ; Rawlins, Ryan Thomas ; Gisolfi, Daniel Nicolas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11188453B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Hicks, Andrew C. M</creatorcontrib><creatorcontrib>Blue, Dale E</creatorcontrib><creatorcontrib>Minerley, Kevin</creatorcontrib><creatorcontrib>Rawlins, Ryan Thomas</creatorcontrib><creatorcontrib>Gisolfi, Daniel Nicolas</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hicks, Andrew C. M</au><au>Blue, Dale E</au><au>Minerley, Kevin</au><au>Rawlins, Ryan Thomas</au><au>Gisolfi, Daniel Nicolas</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Verification of software test quality using hidden variables</title><date>2021-11-30</date><risdate>2021</risdate><abstract>A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises determining a current success rate value (SRV) for the current test that represents a success rate of the current test for the first version of the SUT. The method further comprises combining the current SRV of the first version of the SUT and current SRVs of the current test for prior versions of the SUT into a current test eigenvector associated with the current test. The method further comprises converting the current test eigenvector into a first eigenvalue that represents a health, accuracy, and quality of the first version of the SUT.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US11188453B1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Verification of software test quality using hidden variables
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T18%3A31%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Hicks,%20Andrew%20C.%20M&rft.date=2021-11-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11188453B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true